Chip Monolithic Ceramic Capacitor meet AEC-Q200 for Infotainment GRT32ER61H475KE01 (1210, X5R:EIA, 4.7uF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor used for Car Multimedia, Car Interior, Car Comfort application and General Electronic equipment. Please contact us when using this product for any other applications than described in the above. Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.). 2.MURATA Part NO. System (Ex.) GRT 32 E R6 1H 475 K E01 L (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.3 2.50.2 2.50.2 0.3 min. 1.0 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X5R(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 85 C -15 to 15 % DC 50 V 4.7 uF 10 % -55 to 85 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 1000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 4000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of May.10,2017,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRT32ER61H475KE01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specifications. AEC-Q200 Test Method 1 Pre-and Post-Stress - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Set the capacitor for 100012h at maximum operating temperature 3 . Exposure (Storage) specifications in the following table. Appearance No marking defects Set for 242h at room temperature, then measure. Capacitance R6, C8: Within 12.5% Change Dissipation R6, C8: 0.2 max. Factor Insulation More than 500M or 25 F (Whichever is smaller) Resistance 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No marking defects in the following table. Set for 242h at room temperature, then measure. Capacitance R6, C8: Within 7.5% Step 1 2 3 4 Change Temp. Room 85 +3/-0 (For R6) Room -55+0/-3 (C) Temp. 105+3/-0 (For C8) Temp. Dissipation R6, C8: 0.2 max. Time Factor 153 1 153 1 (min.) Initial measurement Insulation Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then set Resistance for 242h at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) Appearance No marking defects at 853 and 80 to 85% humidity for 100012h. Remove and set for 242h at room temperature, then measure. Capacitance R6,C8: Within 12.5% The charge/discharge current is less than 50mA. Change Dissipation R6,C8: 0.2 max Measurement after test Factor Perform a heat treatment at 150+0/10C for 1h and then let sit for 242h at room temperature, then measure. Insulation More than 100M or 5 F (Whichever is smaller) Resistance JEMCGS-01744M 2