LQH32CH100K53L Murata

Reference Only Spec No. JELF243A-9106F-01 P.1/8 CHIP COILCHIP INDUCTORSLQH32CH53L Murata Standard Reference SpecificationAEC-Q200 1.Scope This Reference specification applies to LQH32CH 53L series, Chip coil (Chip Inductors) for automotive Electronics based on AEC-Q200. 2.Part Numbering (ex) LQ H 32 C H 1R0 M 5 3 L Product ID Structure Dimension Applications Category Inductance Tolerance Features Electrode Packaging (LW) and L:Taping Characteristics 3.Rating Operating Temperature Range. 40 C to + 85 C Storage Temperature Range. 40 C to + 105 C Self Inductance DC Rated ESD Customer MURATA Resonant Resistance Current Rank Part Number Part Number Frequency ( ) (mA) 5A: 8kV (H) Tolerance (MHz min) LQH32CH1R0M53L 1.0 0.06030% 100 1000 LQH32CH2R2M53L 2.2 0.09730% 64 790 LQH32CH3R3M53L 3.3 20% 0.1230% 50 710 LQH32CH4R7M53L 4.7 0.1530% 43 650 5A LQH32CH6R8M53L 6.8 0.2530% 32 540 LQH32CH100K53L 10 0.3030% 26 450 LQH32CH150K53L 15 10% 0.5830% 26 300 LQH32CH220K53L 22 0.7130% 19 250 When applied Rated current to the products , self temperature rise shall be limited to 20 max and Inductance will be within 10% of initial Inductance value. 4. Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temperature / 15C to 35C Temperature : 20C 2C Humidity : Ordinary Humidity / 25%(RH) to 85%(RH) Humidity : 60%(RH) to 70%(RH) Atmospheric Pressure : 86kPa to 106 kPa 5. Appearance and Dimensions 2.5 0.2 2.5 0.2 A A Unit Mass (Typical value) 0.045g 2.5 0.2 A: 2.8max. 3.2 0.3 No marking. 0.9 0.31.3 0.2 0.9 0.3 MURATA MFG.CO., LTD 1.55 0.15Reference Only Spec No. JELF243A-9106F-01 P.2/8 6. Electrical Performance No. Item Specification Test Method 6.1 Inductance Inductance shall meet item 3. Measuring Equipment : KEYSIGHT 4192A or equivalent Measuring Frequency : 1MHz 6.2 DC DC Resistance shall meet item 3. Measuring Equipment : Digital multi meter Resistance 6.3 Self Resonant S.R.F shall meet item 3. Measuring Equipment : Frequency(S.R.F) KEYSIGHT E4991A or equivalent 7. AEC-Q200 Requirement 7.1 Performance (based on Table 5 for Magnetics(Inductors / Transformer) AEC-Q200 Rev.D issued June. 1 2010 AEC-Q200 Murata Specification / Deviation No Stress Test Method 3 High 1000hours at 85 deg C Meet Table A after testing. Temperature Set for 24hours at room Table A Appearance No damage Exposure temperature, then measured. Inductance change Within 5% DC Resistance Within 5% Change 4 Temperature 1000cycles Meet Table A after testing. Cycling -40 deg C to + 85deg C Set for 24hours at room temperature,then measured. 7 Biased Humidity 1000hours at 85 deg C, Meet Table A after testing. 85%RH unpowered. 8 Operational Life Apply 85 deg C 1000 hours Meet Table A after testing. Set for 24hours at room temperature, then measured 9 External Visual Visual inspection No abnormalities 10 Physical Meet ITEM 5 No defects Dimension Style and Dimensions 12 Resistance Per Not Applicable to Solvents MIL-STD-202 Method 215 13 Mechanical Shock Per MIL-STD-202 Meet Table A after testing. Method 213 Condition C: 100gs/6ms/Half sine 14 Vibration 5g s for 20 minutes, No defects 12cycles eah of 3 orientations Test from 10-2000Hz. 15 Resistance No-heating Murata deviation request : to Soldering Heat Solder temperature Pre-heating: 150C+/-5C, 60s+/-5s 260C+/-5 deg C Meet Table A after testing. Immersion time 10s MURATA MFG.CO., LTD