LQH32CH220K23L Murata

SpecNo.JELF243A-9111D-01 P1/8 Reference Only CHIP COILCHIP INDUCTORSLQH32CH23L Murata Standard Reference SpecificationAEC-Q200 1. Scope This reference specification applies to LQH32CH 23L series, Chip coil (Chip Inductors) for automotive Electronics based on AEC-Q200. 2. Part Numbering (ex) LQ H 32 C H 1R0 M 2 3 L Product ID Structure Dimension Applications Category Inductance Tolerance Features Electrode Packaging (LW) and (For Automotive) L:Taping Characteristics 3. Rating Operating Temperature Range. -40 to +85C Storage Temperature Range. -40 to +105C Self Inductance DC Rated ESD Customer MURATA Resonant Resistance Current Rank Part Number Part Number Frequency (H) Tolerance () (mA) 5A: 8kV (MHz min) LQH32CH1R0M23L 1.0 0.0930% 96 800 LQH32CH2R2M23L 2.2 20% 0.1330% 64 600 LQH32CH4R7M23L 4.7 0.2030% 43 450 5A LQH32CH100K23L 10 0.4430% 26 300 10% LQH32CH220K23L 22 0.7130%19 250 When applied Rated current to the Products , self temperature rise shall be limited to 20 max and Inductance will be within 10% of initial Inductance value. 4. Testing Conditions <Unless otherwise specified> <In case of doubt> Temperature : Ordinary Temperature (15 to 35C) Temperature : 20 2C Humidity : Ordinary Humidity (25 to 85 %(RH)) Humidity : 60 to 70%(RH) Atmospheric Pressure : 86 to 106 kPa 5. Appearance and Dimensions 2.50.2 2.50.2 2.50.2 3.20.3 Unit Mass (Typical value) 0.060g No marking. (in mm) 0.90.3 1.30.2 0.90.3 MURATA MFG.CO., LTD 2.00.2SpecNo.JELF243A-9111D-01 P2/8 Reference Only 6. Electrical Performance No. Item Specification Test Method 6.1 Inductance Inductance shall meet item 3. Measuring Equipment: KEYSIGHT 4192A or equivalent Measuring Frequency: 1MHz 6.2 DC Resistance DC Resistance shall meet item 3. Measuring Equipment:Digital multi meter 6.3 Self Resonant S.R.F shall meet item 3. Measuring Equipment : Frequency(S.R.F) KEYSIGHT E4991A or equivalent 7. AEC-Q200 Requirement 7.1 Performance (based on Table 5 for Magnetics(Inductors / Transformer) AEC-Q200 Rev.D issued June. 1 2010 AEC-Q200 Murata Specification / Deviation No Stress Test Method 3 High 1000hours at 85 deg C Meet Table A after testing. Temperature Set for 24hours at room Table A Exposure temperature, then measured. Appearance No damage Inductance change Within 5% DC Resistance Change Within 5% 4 Temperature Cycling1000cycles Meet Table A after testing. -40 deg C to + 85deg C Set for 24hours at room temperature,then measured. 7 Biased Humidity 1000hours at 85 deg C, 85%RH Meet Table A after testing. unpowered.. 8 Operational Life Apply 85 deg C 1000 hours Meet Table A after testing. Set for 24hours at room temperature, then measured 9 External Visual Visual inspection No abnormalities 10 Physical Dimension Meet ITEM 5 No defects (Style and Dimensions) 12 Resistance Per Not Applicable to Solvents MIL-STD-202 Method 215 13 Mechanical Shock Per MIL-STD-202 Meet Table A after testing. Method 213 Condition C: 100gs/6ms/Half sine 14 Vibration 5g s for 20 minutes, No defects 12cycles eah of 3 orientations Test from 10-2000Hz. 15 Resistance No-heating Murata deviation request : to Soldering Heat Solder temperature Pre-heating: 150C+/-5C, 60s+/-5s 260C+/-5 deg C Meet Table A after testing. Immersion time 10s MURATA MFG.CO., LTD