LQM18JNR12J00D Murata

Reference Only Spec No. JELF243B-0077-01 P.1/9 CHIP COIL (CHIP INDUCTOR) LQM18JN00D REFERENCE SPECIFICATION 1.Scope This reference specification applies to LQM18JN 00 series, Chip Coil (Chip Inductors). 2. Part Numbering (ex) LQ M 18 J N R16 J 0 0 D Product ID Structure Dimension Applications Category Inductance Tolerance Dimension Other Packaging (LW) and (T) D:Taping Characteristics *B:BULK *B:Bulk packing also available 3. Rating Operating Temperature Range 40C to + 85C Storage Temperature Range 40C to + 85C Self resonant Customer MURATA Inductance Q Rated current DC resistance frequency Part Number Part Number nH (min.) mA ohm MHz (min.) 0.41 +/-25% 650 LQM18JNR10J00D 100 +/-5% 8 200 610 LQM18JNR12J00D 120 +/-5% 8 0.47 +/-25% 150 550 LQM18JNR16J00D 160 +/-5% 8 0.60 +/-25% 100 4. Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temperature / 15C to 35C Temperature : 20C 2C Humidity : Ordinary Humidity / 25%(RH) to 85%(RH) Humidity : 60%(RH) to 70%(RH) Atmospheric Pressure : 86kPa to 106kPa 5. Appearance and Dimensions 0.4 0.2 Unit Mass (Typical value) Polarity mark 0.004g 0.32 0.20 0.78 0.20 0.5 5 0.10 (in mm) 1.6 0.15 0.80 0.15 MURATA MFG.CO., LTD Reference Only Spec No. JELF243B-0077-01 P.2/9 6. Electrical Performance No. Item Specification Test Method 6.1 Inductance Please refer to 3.Rating. Measuring Equipment: Keysight 4294A or equivalent (1mA) 6.2 Q Measuring Frequency: 25MHz 6.3 DC Resistance Measuring Equipment: Digital multi meter Digital multi meter (TR6846 or equivalent) a terminal1 terminal2 SW b DC resistance shall be measured after putting chip coil between the terminal 2 under the condition of opening between a and b. Every measurement The terminal 1 shall be shorted with a and b are shorted when changing chip coil. 6.4 Self Resonant Measuring Equipment: Frequency Keysight 4991A or equivalent (1mA) (S.R.F) 6.5 Rated Current Self temperature rise shall be limited The rated current is applied. to 40C max. 7. Mechanical Performance No. Item Specification Test Method 7.1 Shear Test Chip coil shall not be damaged after Applied Direction Chip Coil tested as follows. F Substrate Force: 10N Hold Duration: 5s Applied Direction: Parallel to PCB Appearance: No damage Substrate: Glass-epoxy substrate 7.2 Bending Test (100mm40mm1.0mm) Solder: Reflow Pressure jig R2 30 F Deflection (in mm) Product 45 45 Speed of Applying Force: 0.5mm / s Deflection: 2mm Hold Duration: 20s MURATA MFG.CO., LTD