X-On Electronics has gained recognition as a prominent supplier of MRF101AN-81MHZ sub-ghz development tools across the USA, India, Europe, Australia, and various other global locations. MRF101AN-81MHZ sub-ghz development tools are a product manufactured by NXP. We provide cost-effective solutions for sub-ghz development tools, ensuring timely deliveries around the world.

MRF101AN-81MHZ

MRF101AN-81MHZ electronic component of NXP
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Part No.MRF101AN-81MHZ
Manufacturer: NXP
Category:Sub-GHz Development Tools
Description: Sub-GHz Development Tools MRF101AN 81.36 MHz Reference Circuit
Datasheet: MRF101AN-81MHZ Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



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1: USD 885.9768 ea
Line Total: USD 885.98

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Ships to you between Thu. 06 Jun to Mon. 10 Jun

MOQ : 1
Multiples : 1
1 : USD 815.0505

     
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DocumentNumber:MRF101AN NXPSemiconductors Rev. 1, 05/2019 TechnicalData RFPowerLDMOSTransistors MRF101AN HighRuggedness N--Channel MRF101BN Enhancement--ModeLateral MOSFETs ThesedevicesaredesignedforuseinHFandVHFcommunications, industrial,scientificandmedical(ISM)andbroadcastandaerospace 1.8250MHz,100WCW,50V applications. The devices are extremely rugged and exhibit high performance WIDEBAND upto250MHz. RFPOWERLDMOSTRANSISTORS TypicalPerformance: V =50Vdc DD Frequency P G out ps D (MHz) SignalType (W) (dB) (%) S (1) 13.56 CW 130CW 27.1 79.6 (2) 27 CW 125CW 24.9 79.6 (3) 40.68 CW 120CW 23.8 81.5 G (4) S 50 CW 119 CW 22.8 82.1 D (5) 81.36 CW 130CW 23.2 80.8 TO--220--3 (6,7) MRF101AN 87.5108 CW 115 CW 20.6 76.8 (7,8) 136174 CW 104CW 21.2 76.5 S (9) 230 Pulse 115Peak 21.1 76.7 (100 sec,20%Duty Cycle) LoadMismatch/Ruggedness D Frequency P Test in S G SignalType VSWR (MHz) (W) Voltage Result TO--220--3 40.68 CW >65:1 at all 0.64CW 50 NoDevice MRF101BN Phase Degradation Angles 230 Pulse >65:1 at all 1.8Peak 50 NoDevice (100 sec,20% Phase (3dB Degradation Duty Cycle) Angles Overdrive) 1. Measuredin13.56MHz referencecircuit(page5). D 2. Measuredin27MHz referencecircuit(page9). 3. Measuredin40.68MHz referencecircuit(page13). 4. Measuredin50MHz referencecircuit(page17). Backside 5. Measuredin81.36MHz referencecircuit(page21). 6. Measuredin87.5108MHz broadbandreferencecircuit(page25). Note: Exposedbacksideofthepackage G 7. Thevalues shownarethecenterbandperformancenumbers andtabalsoserves as asource across theindicatedfrequency range. terminalforthetransistor. 8. Measuredin136174MHz VHFbroadbandreferencecircuit(page30). S 9. Measuredin230MHz fixture(page34). Features Mirror pinout versions (A andB) tosimplify useinapush--pull, two--upconfiguration Characterizedfrom30to50V Suitablefor linear application IntegratedESD protectionwithgreater negativegate--source voltagerangefor improvedClass C operation IncludedinNXP product longevity program withassured supply for aminimum of 15years after launch TypicalApplications Industrial, scientific, medical(ISM) RadioandVHF TV broadcast Laser generation HF andVHF communications Plasmaetching Switchmodepower supplies Particleaccelerators MRI andother medicalapplications Industrialheating, weldinganddryingsystems 20182019NXPB.V. MRF101ANMRF101BN RF DeviceData NXP Semiconductors 1Table1.MaximumRatings Rating Symbol Value Unit Drain--SourceVoltage V 0.5,+133 Vdc DSS Gate--SourceVoltage V 6.0,+10 Vdc GS OperatingVoltage V 50 Vdc DD StorageTemperatureRange T 65to+150 C stg CaseOperatingTemperatureRange T 40to+150 C C (1,2) OperatingJunctionTemperatureRange T 40to+175 C J TotalDeviceDissipation T =25 C P 182 W C D Derateabove25 C 0.91 W/ C Table2.ThermalCharacteristics (2,3) Characteristic Symbol Value Unit ThermalResistance,JunctiontoCase R 1.1 C/W JC CW:CaseTemperature77 C,150W CW,50Vdc,I =100mA,40.68MHz DQ ThermalImpedance,JunctiontoCase Z 0.37 C/W JC Pulse:CaseTemperature73C,113W Peak,100 sec PulseWidth,20%Duty Cycle, 50Vdc,I =100mA,230MHz DQ Table3.ESDProtectionCharacteristics TestMethodology Class HumanBody Model(perJS--001--2017) 1B,passes 1000V ChargeDeviceModel(perJS--002--2014) C3,passes 1200V Table4.ElectricalCharacteristics (T =25 Cunless otherwisenoted) A Characteristic Symbol Min Typ Max Unit OffCharacteristics Gate--SourceLeakageCurrent I 1 Adc GSS (V =5Vdc,V =0Vdc) GS DS Drain--SourceBreakdownVoltage V 133 Vdc (BR)DSS (V =0Vdc,I =50mAdc) GS D ZeroGateVoltageDrainLeakageCurrent I 10 Adc DSS (V =100Vdc,V =0Vdc) DS GS OnCharacteristics GateThresholdVoltage V 1.7 2.2 2.7 Vdc GS(th) (V =10Vdc,I =290 Adc) DS D GateQuiescentVoltage V 2.5 Vdc GS(Q) (V =50Vdc,I =100mAdc) DS D Drain--SourceOn--Voltage V 0.45 Vdc DS(on) (V =10Vdc,I =1Adc) GS D ForwardTransconductance g 7.1 S fs (V =10Vdc,I =8.8Adc) DS D 1. Continuous useatmaximum temperaturewillaffectMTTF. 2. MTTFcalculatoravailableat

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8543.70.00 Other machines and apparatus Free
13 Signal processors (graphic equalisers, crossovers etc.) 91 Other Free

9027.10.00 Instruments and apparatus for physical or chemical analysis (eg, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes Free

9031.80.00 MEASURING OR CHECKING INSTRUMENTS, APPLIANCES AND MACHINES, NOT SPECIFIED OR INCLUDED ELSEWHERE IN THIS CHAPTER; PROFILE PROJECTORS Other instruments, appliances and machines Free

9030.31.00 Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiations.
Other instruments and apparatus, for measuring or checking voltage, current, resistance or power Multimeters without a recording device Free

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.Other 71 No Weighing less than 1kg Free

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8538 PARTS SUITABLE FOR USE SOLELY OR PRINCIPALLY WITH THE APPARATUS OF 8535, 8536 OR 8537:
8538.10.10 22 For programmable controllers Free
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