CAT24C03VP2I-GT3 ON Semiconductor

CAT24C03, CAT24C05 2 2-Kb and 4-Kb I C Serial EEPROM with Partial Array Write Protection Description CAT24C03, CAT24C05 Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature 65 to +150 C Voltage on any pin with respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The DC input voltage on any pin should not be lower than 0.5 V or higher than V + 0.5 V. During transitions, the voltage on any pin may CC undershoot to no less than 1.5 V or overshoot to no more than V + 1.5 V, for periods of less than 20 ns. CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program / Erase Cycles END T Data Retention 100 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C. CC Table 3. D.C. OPERATING CHARACTERISTICS (V = 1.8 V to 5.5 V, T = 40C to +85C, unless otherwise specified.) CC A Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz 1 mA CCR SCL I Write Current Write, f = 400 kHz 1 mA CCW SCL I Standby Current All I/O Pins at GND or V 1 A SB CC I I/O Pin Leakage Pin at GND or V 1 A L CC V Input Low Voltage 0.5 V x 0.3 V IL CC V Input High Voltage V x 0.7 V + 0.5 V IH CC CC V Output Low Voltage V 2.5 V, I = 3 mA 0.4 V OL1 CC OL V Output Low Voltage V < 2.5 V, I = 1 mA 0.2 V OL2 CC OL