CD Driver, 1/4, 1/3-Duty General-Purpose LC75829PW Overview The LC75829PW is 1/4 duty and 1/3 duty general purpose microprocessor controlled LCD driver that can be used in www.onsemi.com applications such as frequency display in products with electronic tuning. In addition to being able to drive up to 208 segments directly, the LC75829PW can also control up to 4 generalpurpose output ports. Incorporation of an oscillation circuit helps to reduce the number of external resistors and capacitors required. SPQFP64 10x10 / SQFP64 Features CASE 131AK Support for 1/4duty 1/3bias or 1/3duty 1/3bias Drive Techniques under Serial Data Control MARKING DIAGRAM When 1/4duty: Capable of Driving up to 208 Segments When 1/3duty: Capable of Driving up to 159 Segments Serial Data Input Supports CCB* Format Communication with the System Controller (Support 3.3 V and 5 V Operation) LC75829 YMDDD Serial Data Control of the PowerSaving Mode Based Backup Function and the All Segments Forced Off Function Serial Data Control of Switching between the Segment Output Port and GeneralPurpose Output Port Function (Support for up to 4 GeneralPurpose Output Ports) LC75829 = Specific Device Code Y = Year Support for Clock Output Function of 1ch M = Month Serial Data Control of the Frame Frequency of the Common and DDD = Additional Traceability Data Segment Output Waveforms Serial Data Control of Switching between the Internal Oscillator ORDERING INFORMATION Operating Mode and External Clock Operating Mode See detailed ordering and shipping information on page 22 of High Generality, since Display Data is Displayed Directly without this data sheet. the Intervention of a Decoder Circuit The INH Pin Allows the Display to be Forced to the Off State Incorporation of an Oscillator Circuit (Incorporation of Resistor and Capacitor for an Oscillation) *Computer Control Bus (CCB) is an ON Semiconductors original bus format and the bus addresses are controlled by ON Semiconductor. Semiconductor Components Industries, LLC, 2017 1 Publication Order Number: June, 2020 Rev. 2 LC75829PE PW/DLC75829PW SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS (T = 25C, V = 0 V) A SS Parameter Symbol Conditions Ratings Unit Maximum Supply Voltage V max V 0.3 to +6.5 V DD DD Input Voltage V 1 CE, CL, DI, INH 0.3 to +6.5 V IN V 2 OSCI, V 1, V 2 0.3 to V +0.3 IN DD DD DD Output Voltage V S1 to S53, COM1 to COM4, P1 to P4 0.3 to V +0.3 V OUT DD Output Current I 1 S1 to S52 300 A OUT mA I 2 COM1 to COM4, S53 3 OUT I 3 P1 to P4 5 OUT Allowable Power Dissipation Pd max T = 85 C 200 mW A Operating Temperature Topr 40 to +85 C Storage Temperature Tstg 55 to +125 C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. RECOMMENDED OPERATING RANGES (T = 40 to +85C, V = 0 V) A SS Ratings Min Typ Max Parameter Symbol Conditions Unit Supply Voltage V V 4.5 6.0 V DD DD Input Voltage V V 1 V 1 2/3 V V DD DD DD DD V 2 V 2 1/3 V V DD DD DD DD Input HighLevel Voltage V 1 CE, CL, DI, INH 0.4 V 6.0 V IH DD V 2 OSCI: External clock operating mode 0.4 V V IH DD DD Input LowLevel Voltage V 1 CE, CL, DI, INH 0 0.2 V V IL DD V 2 OSCI: External clock operating mode 0 0.2 V IL DD External Clock Operating f OSCI: External clock operating mode 10 300 600 kHz CK Frequency Figure 4 External Clock Duty Cycle D OSCI: External clock operating mode 30 50 70 % CK Figure 4 Data Setup Time tds CL, DI Figure 2 Figure 3 160 ns Data Hold Time tdh CL, DI Figure 2 Figure 3 160 ns CE Wait Time tcp CE, CL Figure 2 Figure 3 160 ns CE Setup Time tcs CE, CL Figure 2 Figure 3 160 ns CE Hold Time tch CE, CL Figure 2 Figure 3 160 ns HighLevel Clock Pulse Width t H CL Figure 2 Figure 3 160 ns LowLevel Clock Pulse Width t L CL Figure 2 Figure 3 160 ns Rise Time tr CE, CL, DI Figure 2 Figure 3 160 ns Fall Time tf CE, CL, DI Figure 2 Figure 3 160 ns INH Switching Time tc INH, CE Figure 17 Figure 18 10 s Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. www.onsemi.com 2