LM2574N-3.3G ON Semiconductor

LM2574, NCV2574 0.5 A, Adjustable Output Voltage, StepDown Switching Regulator The LM2574 series of regulators are monolithic integrated circuits ideally suited for easy and convenient design of a stepdown LM2574, NCV2574 Typical Application (Fixed Output Voltage Versions) Feedback (3) L1 7.0 40 V +V 1 in LM2574 330 H Unregulated Output 5 DC Input 5.0 V Regulated C (14) in (12) Output 0.5 A Load 7 D1 22 F C out 2 Sig4OPwr 3N/OFF 1N5819 220 F Gnd Gnd (4) (6) (5) Representative Block Diagram and Typical Application +V in ON/OFF Unregulated 3.1 V Internal Output R2 ON/OFF DC Input Regulator Voltage Versions ( ) 5 (12) 3 C 3.3 V 1.7 k in (5) 5.0 V 3.1 k 1 (3) 12 V 8.84 k 15 V 11.3 k Feedback Current For adjustable version Limit R2 Fixed Gain R1 = open, R2 = 0 Error Amplifier Comparator Driver R1 Latch Freq 1.0 k L1 V out Shift Output 18 kHz 1.0 Amp 7 (14) Sig Gnd 1.235 V Switch Pwr Gnd C D1 out BandGap Thermal 52 kHz 2 4 Reset Reference Load Shutdown Oscillator (4) (6) NOTE: Pin numbers in ( ) are for the SO16W package. Figure 1. Block Diagram and Typical Application ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur). Rating Symbol Value Unit Maximum Supply Voltage V 45 V in ON/OFF Pin Input Voltage 0.3 V V +V V in Output Voltage to Ground (Steady State) 1.0 V DW Suffix, Plastic Package Case 751G Max Power Dissipation P Internally Limited W D Thermal Resistance, JunctiontoAir 145 C/W R JA N Suffix, Plastic Package Case 626 Max Power Dissipation P Internally Limited W D Thermal Resistance, JunctiontoAmbient R 100 C/W JA Thermal Resistance, JunctiontoCase 5.0 C/W R JC Storage Temperature Range T 65C to +150C C stg Minimum ESD Rating 2.0 kV (Human Body Model: C = 100 pF, R = 1.5 k ) Lead Temperature (Soldering, 10 seconds) 260 C Maximum Junction Temperature T 150 C J Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. NOTE: ESD data available upon request.