NCP103MXTCGEVB ON Semiconductor

Test Procedure for the NCP103MXTCGEVB Evaluation Board There is a collection test procedures for NCP103 demoboards. This paper offers some helpful test configuration for first contact with ONSEMI NCP103 LDO. 1. QUIESCENT CURRENT V +1V or 2.5V out nom DC Supply - + A Figure 1: Test configuration for measurement I , Quiescent Current Q 1. Connect circuit as shown figure on 1 2. Apply voltage at V Default test V is V +1 V or 2.5 V whichever is greater Input. input out nom 3. Value shown A meter is measured quiescent current. 4. Measurement is finished. Disconnect supply voltage. *Note Be carefully if any device is connected on output, because leakage current can affect measurement accuracy. 5/29/2014 1 www.onsemi.com 2. LOAD REGULATION V +1V or 2.5V out nom DC Electronic Supply load - - + + V I OUT 150 mA 1 mA A Figure 2: Test configuration for measurement REG , Load Regulation LOAD 1. Connect circuit as shown figure on 2 2. Apply voltage at V Default test V is V +1 V or 2.5 V whichever is greater Input. input out nom 3. Set minimal required current I , e.g. 1 mA, and switch load ON. 1 4. Note the value V1 from voltmeter Vo. 5. Switch load OFF and set maximal required current I2, e.g. 150 mA and switch load ON. 6. Note the value V2 from voltmeter Vo. 7. Load regulation is obtained via following formula: REG =(V -V ), V LOAD 1 2 8. Measurement is finished. Disconnect supply voltage. 5/29/2014 2 www.onsemi.com