Product Information

NCV302HSN45T1G

NCV302HSN45T1G electronic component of ON Semiconductor

Datasheet
Supervisory Circuits ANA UNDERVOLT DETECT

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 0.4584 ea
Line Total: USD 0.46

165850 - Global Stock
Ships to you between
Fri. 03 May to Thu. 09 May
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
165850 - Global Stock


Ships to you between Fri. 03 May to Thu. 09 May

MOQ : 1
Multiples : 1

Stock Image

NCV302HSN45T1G
ON Semiconductor

1 : USD 0.4584

165850 - Global Stock


Ships to you between Fri. 03 May to Thu. 09 May

MOQ : 16
Multiples : 1

Stock Image

NCV302HSN45T1G
ON Semiconductor

16 : USD 0.4678

     
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RoHS - XON
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NCP302, NCP303 Voltage Detector Series with Programmable Delay The NCP302 and NCP303 series are second generation ultralow current voltage detectors that contain a programmable time delay generator. These devices are specifically designed for use as reset NCP302, NCP303 MAXIMUM RATINGS Rating Symbol Value Unit Input Power Supply Voltage (Pin 2) V 12 V in Delay Capacitor Pin Voltage (Pin 5) V 0.3 to V + 0.3 V CD in Output Voltage (Pin 1) V V OUT Complementary, NCP302 0.3 to V + 0.3 in NChannel Open Drain, NCP303 0.3 to 12 Output Current (Pin 1) (Note 2) I 70 mA OUT Thermal Resistance JunctiontoAir R 250 C/W JA Maximum Junction Temperature T +150 C J Operating Ambient Temperature Range All Voltage Options: 0.9 V to 1.1 V T 40 to +85 C A All Voltage Options: 1.2 V to 4.9 V T 40 to +125 C A Storage Temperature Range T 55 to +150 C stg Moisture Sensitivity Level MSL 1 Latchup Performance (Note 3) I mA LATCHUP Positive 200 Negative 200 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. This device series contains ESD protection and exceeds the following tests: Human Body Model 2000 V per MILSTD883, Method 3015. Machine Model Method 200 V. 2. The maximum package power dissipation limit must not be exceeded. T T J(max) A P D R JA 3. Maximum ratings per JEDEC standard JESD78.

Tariff Desc

8542.31.00 51 No ..Application Specific (Digital) Integrated Circuits (ASIC)

Electronic integrated circuits: Processors and controllers, whether or not combined with memories, converters, logic circuits, amplifiers, clock and timing circuits, or other circuits
Monolithic integrated circuits:
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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