SPC584B70E1NHC0X STMicroelectronics

SPC584Bx 32-bit Power Architecture microcontroller for automotive ASIL-B applications Datasheet - production data Memory Error Management Unit (MEMU) for collection and reporting of error events in memories Cyclic redundancy check (CRC) unit eTQFP64 (10 x 10 x 1.0 mm) eTQFP100 (14 x 14 x 1.0 mm) Enhanced low power support Ultra low power STANDBY Smart Wake-up Unit Fast wake-up and execute from RAM Enhanced modular IO subsystem (eMIOS): up eTQFP144 (20 x 20 x 1.0 mm) eTQFP176 (24 x 24 x 1.4 mm) to 64 timed I/O channels with 16-bit counter resolution Features Body cross triggering unit (BCTU) AEC-Q100 qualified Triggers ADC conversions from any eMIOS channel High performance e200z420 Triggers ADC conversions from up to 2 32-bit Power Architecture technology CPU dedicated PIT RTIs Core frequency as high as 120 MHz Enhanced analog-to-digital converter system Variable Length Encoding (VLE) with: KB data 2112 KB (2048 KB code flash + 64 2 independent fast 12-bit SAR analog flash) on-chip flash memory: supports read converters during program and erase operations, and 1 supervisor 12-bit SAR analog converter multiple blocks allowing EEPROM emulation 1 10-bit SAR analog converter with STDBY 176 KB HSM dedicated flash memory (144 KB mode support code + 32 KB data) Communication interfaces 128 KB on-chip general-purpose SRAM (in 1 Ethernet controller 10/100 Mbps, addition to 64 KB core local data RAM compliant IEEE 802.3-2008 Crossbar switch architecture for concurrent 8 MCAN interfaces with advanced shared access to peripherals, Flash, or RAM from memory scheme and ISO CAN-FD support multiple bus masters with end-to-end ECC 14 LINFlexD modules Multi-channel direct memory access controller 7 Deserial Serial Peripheral Interface (eDMA) with 64 channels (DSPI) modules 1 interrupt controller (INTC) Dual phase-locked loops with stable clock Comprehensive new generation ASIL-B safety domain for peripherals and FM modulation concept domain for computational shell ASIL-B of ISO 26262 Nexus Development Interface (NDI) per IEEE- FCCU for collection and reaction to failure ISTO 5001-2003 standard, with some support notifications for 2010 standard September 2019 DS11701 Rev 4 1/142 This is information on a product in full production. www.st.comSPC584Bx Boot Assist Flash (BAF) supports factory programming using a serial bootload through the asynchronous CAN or LIN/UART Junction temperature range -40 C to 150 C Table 1. Device summary Part number Package 1 MB 1.5 MB 2 MB eTQFP64 SPC584B60E1 SPC584B64E1 SPC584B70E1 eTQFP100 SPC584B60E3 SPC584B64E3 SPC584B70E3 eTQFP144 SPC584B60E5 SPC584B64E5 SPC584B70E5 eLQFP176 SPC584B60E7 SPC584B64E7 SPC584B70E7 2/142 DS11701 Rev 4