2600B System SourceMeter SMU Instruments Datasheet Key Features Tightly integrated, 4-quadrant voltage/current source and measure instruments offer best in class performance with 6-digit resolution Family of models offer industrys widest dynamic range: 10 A pulse to 0.1 fA and 200 V to 100 nV Built-in web browser based software enables remote control through any browser, on any computer, from anywhere in the world Compatibility with the Keithley IVy mobile app enables true plug & play I/V characterization and test through any Android device TSP (Test Script Processing) technology embeds A Tektronix Company complete test programs inside the instrument for best- in-class system-level throughput The Series 2600B System SourceMeter SMU Instruments TSP-Link expansion technology for multi-channel are the industrys leading current/voltage source and parallel test without a mainframe measure solutions, and are built from Keithleys third Software emulation for Keithleys 2400 SourceMeter generation SMU technology. The Series 2600B offers SMU Instrument single- and dual-channel models that combine the USB 2.0, LXI-C, GPIB, RS-232, and digital I/O interfaces capabilities of a precision power supply, true current source, 6-digit DMM, arbitrary waveform generator, Free software drivers and development/debug tools pulse generator, and electronic load all into one tightly Optional ACS-Basic semiconductor component integrated instrument. The result is a powerful solution characterization software that significantly boosts productivity in applications ranging from bench-top I-V characterization through Perform Quick I-V Characterization highly automated production test. Built-in web browser based software enables I-V testing through any computer with Android Devices from anywhere in the world. Or, use your Android smart The Series 2600B is compatible with the Keithley IVy device to perform plug & play I-V testing with fingertip application that is the fastest and easiest way to perform control with the Keithley IVy application. For automated current-voltage (I-V) characterization, troubleshoot your system applications, the Series 2600Bs Test Script Processor (TSP ) runs complete test programs from inside the instrument for industry-best throughput. In larger, multi-channel applications, Keithleys TSP-Link Technology works together with TSP Technology to enable high-speed, SMU-per-pin parallel testing. Because Series 2600B SourceMeter SMU Instruments have fully isolated channels that do not require a mainframe, they can be easily reconfigured and re-deployed as your test applications evolve. Perform quick I-V characterization with fingertip control to gain insight into your DUT.Datasheet device under test (DUT), and share the measurement SMU-Per-Pin Parallel Testing results with others. It allows you to visualize, interact with, with TSP-Link Technology and share measurement results without programming, while gaining a deeper understanding of your DUT. These TSP-Link is a channel expansion bus that enables multiple unique capabilities boost productivity across a wide range Series 2600Bs to be inter-connected and function as a of applications in R&D, education, QA/FA, and more. single, tightly-synchronized, multi-channel system. The 2600Bs TSP-Link Technology works together with its TSP technology to enable high-speed, SMU-per-pin parallel Unmatched Throughput testing. Unlike other high-speed solutions such as large for Automated Test with ATE systems, the 2600B achieves parallel test performance without the cost or burden of a mainframe. The TSP-Link TSP Technology based system also enables superior flexibility, allowing for quick For test applications that demand the highest levels of and easy system re-congfi uration as test requirements change. automation and throughput, the 2600Bs TSP technology delivers industry-best performance. TSP technology goes <500ns far beyond traditional test command sequencers it fully embeds then executes complete test programs from within the SMU instrument itself. This virtually eliminates all the time-consuming bus communications to and from the PC controller, and thus dramatically improves overall SMU1 test times. SMU2 SMU3 Test Script Conditional branching Advanced calculations SMU4 and flow control Variables Pass/Fail test Prober/Handler control All channels in the TSP-Link system are synch ronized to under 500ns. Datalogging/ Formatting DUT Test 1 Test 2 Test 3 running running running TSP technology executes complete test programs from the 2600Bs non-volatile memory. GPIB, USB, or Ethernet To To To TSP-Link Device 1 Device 2 Device 3 SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test throughput and lowers the cost of test. 2400 Software Emulation The Series 2600B is compatible with test code developed for Keithleys 2400 SourceMeter SMU instrument. This enables an easier upgrade from 2400-based test systems to Series 2600B, and can improve test speeds by as much as 80%. In addition, it provides a migration path from SCPI programming to Keithleys TSP technology, which when implemented can improve test times even more. For complete support of legacy test systems, the 2400s Source-Memory- List test sequencer is also fully supported in this mode. 2 TEK.COM