TC4013BP(N,F Toshiba

TC4013BP/BF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4013BP, TC4013BF TC4013B Dual D-Type Flip Flop TC4013B contains two independent circuits of D type flip-flop. TC4013BP The input level applied to DATA input are transferred to Q and Q output by rising edge of the clock pulse. When SET input is placed at H, and RESET input is placed at L, outputs become Q = H, and Q = L. When RESET input is placed at H, and SET input is placed at L, outputs become Q = L, and Q = H. When both of RESET input and SET input are at H, outputs become Q = H and Q = H. Pin Assignment TC4013BF Weight DIP14-P-300-2.54 : 0.96 g (typ.) SOP14-P-300-1.27A : 0.18 g (typ.) Block Diagram Start of commercial production 1985-02 1 2014-03-01 TC4013BP/BF Truth Table Inputs Outputs RESET SET DATA CK Qn + 1 Qn + 1 L H * * H L H L * * L H H H * * H H L L L L H L L H H L L L * Qn Qn *: Dont care : Level change : No change Logic Diagram Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit DC supply voltage V V 0.5 to V + 20 V DD SS SS Input voltage V V 0.5 to V + 0.5 V IN SS DD Output voltage V V 0.5 to V + 0.5 V OUT SS DD DC input current I 10 mA IN Power dissipation P 300 (DIP)/180 (SOP) mW D Operating temperature range T 40 to 85 C opr Storage temperature range T 65 to 150 C stg Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 2 2014-03-01