TC4050BF(EL,N,F) Toshiba

TC4049,4050BP/BF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4049BP, TC4049BF TC4050BP, TC4050BF TC4049B Hex Buffer/Converter (inverting type) TC4050B Hex Buffer/Converter (non-inverting type) TC4049B, TC4050B contain six circuits of buffers. TC4049B is TC4049BP, TC4050BP inverter type and TC4050B is non-inverter type. Since one TTL or DTL can be directly driven having large output current, these are useful for interfacing from CMOS to TTL or DTL. As voltage up to V + 18 volts can be applied to the SS input regardless of V , these can be also used as the level DD converter ICs which converts CMOS logical circuits of 15 volts or 10 volts system to CMOS/TTL logical circuits of 5 volts system. Ideal switching characteristic has been obtained by the circuit diagram of three stage inverters for TC4049B and two stage TC4049BF, TC4050BF inverters for TC4050B. Weight DIP16-P-300-2.54A : 1.00 g (typ.) SOP16-P-300-1.27A : 0.18 g (typ.) Start of commercial production 1978-05 1 2014-03-01 TC4049,4050BP/BF Pin Assignment TC4049B TC4050B Circuit Diagram 1/6 TC4049B 1/6 TC4050B Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit DC supply voltage V V 0.5 to V + 20 V DD SS SS Input voltage V V 0.5 to V + 20 V IN SS SS Output voltage V V 0.5 to V + 0.5 V OUT SS DD DC input current I 10 mA IN Power dissipation P 300 (DIP)/180 (SOP) mW D Operating temperature range T 40 to 85 C opr Storage temperature range T 65 to 150 C stg Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 2 2014-03-01