Si1443EDH www.vishay.com Vishay Siliconix P-Channel 30 V (D-S) MOSFET FEATURES SC-70 (6 leads) SOT-363 Single TrenchFET power MOSFET S Typical ESD performance 1500 V HBM 4 D 100 % R tested 5 g D Material categorization: 6 for definitions of compliance please see www.vishay.com/doc 99912 3 G APPLICATIONS 2 D S Load switch for portable devices 1 D - Cellular phone Top View - DSC Marking code: BT - Portable game console - MP3 PRODUCT SUMMARY G - GPS R V (V) -30 DS Soft turn-on load switch R max. ( ) at V = -10 V 0.054 DS(on) GS R max. ( ) at V = -4.5 V 0.062 DS(on) GS R max. ( ) at V = -2.5 V 0.085 D DS(on) GS P-Channel MOSFET Q typ. (nC) 8.6 g a I (A) -4 D Configuration Single ORDERING INFORMATION Package SC-70 Lead (Pb)-free and halogen-free Si1443EDH-T1-GE3 ABSOLUTE MAXIMUM RATINGS (T = 25 C, unless otherwise noted) A PARAMETER SYMBOL LIMITUNIT Drain-source voltage V -30 DS V Gate-source voltage V 12 GS a T = 25 C -4 C a T = 70 C -4 C Continuous drain current (T = 150 C) I J D a, b, c T = 25 C -4 A b, c T = 70 C -3.4 A A Pulsed drain current (t = 300 s) I -15 DM T = 25 C -2.3 C Continuous source-drain diode current I S b, c T = 25 C -1.3 A T = 25 C 2.8 C T = 70 C 1.8 C Maximum power dissipation P W D b, c T = 25 C 1.6 A b, c T = 70 C 1 A Operating junction and storage temperature range T , T -55 to +150 J stg C Soldering recommendations (peak temperature) 260 THERMAL RESISTANCE RATINGS PARAMETER SYMBOL TYPICALMAXIMUMUNIT b, d Maximum junction-to-ambient t 5 s R 60 80 thJA C/W Maximum junction-to-foot (drain) Steady state R 34 45 thJF Notes a. Package limited b. Surface mounted on 1 x 1 FR4 board c. t = 5 s d. Maximum under steady state conditions is 125 C/W S12-0980-Rev. B, 30-Apr-12 Document Number: 67849 1 For technical questions, contact: pmostechsupport vishay.com THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc 91000 Si1443EDH www.vishay.com Vishay Siliconix SPECIFICATIONS (T = 25 C, unless otherwise noted) J PARAMETER SYMBOL TEST CONDITIONS MIN.TYP.MAX.UNIT Static Drain-source breakdown voltage V V = 0 V, I = -250 A -30 - - V DS GS D V temperature coefficient V /T --22 - DS DS J I = -250 A mV/C D V temperature coefficient V /T -2.6 - GS(th) GS(th) J Gate-source threshold voltage V V = V , I = -250 A -0.6 - -1.5 V GS(th) DS GS D V = 0 V, V = 12 V - - 20 DS GS Gate-source leakage I GSS V = 0 V, V = 4.5 V - - 1 DS GS A V = -30 V, V = 0 V - - -1 DS GS Zero gate voltage drain current I DSS V = -30 V, V = 0 V, T = 55 C - - -10 DS GS J a On-state drain current I V -5 V, V = -10 V -15 - - A D(on) DS GS V = -10 V, I = -4.3 A - 0.043 0.054 GS D a Drain-source on-state resistance R V = -4.5 V, I = -4 A - 0.049 0.062 DS(on) GS D V = -2.5 V, I = -3.5 A - 0.067 0.085 GS D a Forward transconductance g V = -15 V, I = -4.3 A - 14 - S fs DS D b Dynamic V = -15 V, V = -10 V, I = -4.3 A - 18.5 28 DS GS D Total gate charge Q g -8.6 13 nC Gate-source charge Q V = -15 V, V = -4.5 V, I = -4.3 A -1.7 - gs DS GS D Gate-drain charge Q -2.5 - gd Gate resistance R f = 1 MHz 90 450 900 g Turn-on delay time t - 125 188 d(on) Rise time t - 220 330 r V = -15 V, R = 4.4 DD L I -3.4 A, V = 4.5 V, R = 1 Turn-off delay time t -D GEN g11151673 d(off) Fall time t - 435 653 f ns Turn-on delay time t -40 60 d(on) Rise time t -64 98 r V = -15 V, R = 4.4 DD L I -3.4 A, V = -10 V, R = 1 Turn-off delay time t -D GEN g18002700 d(off) Fall time t - 420 630 f Drain-Source Body Diode Characteristics Continuous source-drain diode current I T = 25 C - - -2.3 S C A Pulse diode forward current I -- -15 SM Body diode voltage V I = -3.4 A, V = 0 V - -0.85 -1.2 V SD S GS Body diode reverse recovery time t -14 21 ns rr Body diode reverse recovery charge Q - 7 14 nC rr I = -3.4 A, di/dt = 100 A/s, F T = 25 C Reverse recovery fall time t J -9- a ns Reverse recovery rise time t -5- b Notes a. Pulse test pulse width 300 s, duty cycle 2% b. Guaranteed by design, not subject to production testing Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. S12-0980-Rev. B, 30-Apr-12 Document Number: 67849 2 For technical questions, contact: pmostechsupport vishay.com THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc 91000