DLA Land and Maritime - VQ Supplemental Information Sheet for Electronic QML-19500 Specification Details: Date: 7/29/2015 Specification: MIL-PRF-19500 Title: Semiconductor Devices Federal Supply Class (FSC): 5961 Conventional: No Specification contains quality assurance program: Yes MIL-STD-790 Established Reliability & High Reliability: No MIL-STD-690 Failure Rate Sampling Plans & Procedures: No Weibull Graded: No Specification contains space level reliability requirements: Yes Specification allows test optimization: No Contact Information: Office of Primary Involvement: Electronic Devices Branch, DLA Land and Maritime - VQE Primary Qualifying Activity Contact: 614-692-0611, e-mail: vqe.zk dla.mil Secondary Qualifying Activity Contact: 614-692-7527, e-mail: vqe.rm dla.mil Notes: This listing of discrete semiconductors applies only to products produced on the MIL-PRF-19500 certified/approved line(s) at the plant(s) listed at the back of the QML for the applicable manufacturer. The number in parenthesis next to some manufacturers listings correlates to the plant(s) listed for the manufacturer. Therefore, only those products that have been fabricated, assembled, and tested on the certified/qualified lines herein can be supplied as qualified products. The parts listing indicates the certification/approval status for each manufacturer. This can be found in theCertification Statu column which accompanies each part listing. There are four possible certification/approval options. The following list identifies each certification/approval option and the abbreviation used in this listing: C - Certification to the Quality Management Program outlined in Appendix C TC - Transitional Certification to the Quality Management Program outlined in Appendix C D - Certification to the Quality Program of Appendix D DMS - Approval to the Diminishing Manufacturing Sources (DMS) provisions in MIL-PRF-19500 In addition to the options for certification there are two levels of certification JAN, JANTX, JANTXV certification and JANS certification. The transitional certification to Appendix C option is for manufacturers in the process of making the transition from their previously certified Appendix D certification to an Appendix C certification. Manufacturers not able to comply with the certification requirements of either appendix C or D may be granted a DMS approval. DMS approvals are intended to provide a qualified source of supply for difficult procurement situations. Please refer to the latest revision of MIL-PRF-19500 for details. MIL-PRF-19500 Appendix C contains provisions for test optimization for all listed processes and products for all device classes. Under these provisions traditional screens and Conformance Inspections (CI) can be optimized if found to be non-value added through the manufacturers up front controls and monitors in the wafer fabrication, assembly, and test areas as well as by design. Optimization of these screens and inspections in no way adversely affects the devices military form, fit, and function. Regardless of screening or CI testing optimization, the manufacturer is still responsible for supplying products capable of passing any screening or CI tests prescribed in MIL-PRF-19500 and in the performance specification sheet. 1. The Government designation includes the JAN prefix: * - Includes JAN and JANTX quality levels ** - Includes JAN, JANTX and JANTXV quality levels S - Includes JANS quality level only V - Includes JANTXV quality level only + - Includes JANTX quality level only ++ - Includes JANTX and JANTXV quality levels only JANHC - Includes JANHC quality level only JANKC - Includes JANKC quality level only 2. Radiation Hardness Assurance (RHA) levels: M - Total ionizing dose 310 3 (RAD(Si)) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) D - Total ionizing dose 110 4 (RAD(Si)) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) P - Total ionizing dose 3x10 4 (RAD(Si)) Neutron fluence 2x10 12 (N/cm 2) (Unless otherwise specified) L - Total ionizing dose 510 4 (RAD(Si)) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) R - Total ionizing dose 110 5 (RAD(Si)) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) F - Total ionizing dose 310 5 (RAD(Si)) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) G - Total ionizing dose 510 5 (RAD(Si) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) H - Total ionizing dose 110 6 (RAD(Si)) Neutron fluence 210 12 (N/cm 2 ) (Unless otherwise specified) Note: Government type designation will include product assurance level or followed by RHA level. The RHA level listed is the maximum level achieved during qualification testing. Manufacturer may supply any RHA level less than or equal to that listed.) 3. Electrostatic Discharge (ESD) Sensitivity Classifications: Class 0: Less than 250V -1- Supplemental Information Sheet for Electronic QML-19500Class 1A: 250V - 499V Class 1B: 500V - 999V Class 1C: 1,000V - 1,999V Class 1: 0V - 1,999V Class 2: 2,000V - 3,999V Class 3A: 4,000V - 7,999V Class 3B: 8,000V - 15,999V Class 3: 4,000V - 15,999V Non-sensitive: Above 15,999V 4. Lead finish. These are the default lead finishes unless otherwise specified in the acquisition document: A - Hot solder dip or Tin-lead plate C - Gold plate J - Silver clad or solid silver 5. These notes will apear next to the part number when applicable: 1/ Manufacturer has issued an end of life buy notice for these device types. Contact manufacturer for further information. 3/ Traceable die bank being utilized. 4/ These device types have been declaredInactive for New Desig. Refer to the applicable notice for the date of inactivation. The listings for these device types will be maintained until acquisition of the product is no longer required. 5/ Manufacturing of qualified product was discontinued at this plant. Listing will be removed once inventory is depleted. 6/ Testing is compliant to the latest revision of MIL-STD-750 Test Method 1020.3. Part Configuration: The Part or Identifying Number (PIN) for encapsulated semiconductor devices is formulated as follows: JAN Brand RHA Component Identification Suffix and Designator Designation Number Letters Quality Level JANQQQ A XN YYYY ZZZ The PIN for unencapsulated semiconductor devices is formulated as follows: JAN Brand RHA Component Identification Suffix Quality Level Designator Designation Number Letters and Identifiers JANQCW A XN YYYY ZZ PART LISTINGS MANUFAC- SUPPLIER S INFORMATION TURER S TEST OR PRF CERTIFI- (ADDRESSES ON LAST PAGE) GOVERNMENT TYPE LEAD ESD DESIGNATING QUALIFICATION SPEC CATION DESIGNATION FINISH CLASS SYMBOL REFERENCE SHEET STATUS MFR. CAGE SUPPLIER S NAME (MFR OR PLANT) S ** ** ** ** 1N ** 1N194 6/ NS CDWR 19500-4216-14 /118 D 43611 Microsemi Lawrence (18) ** 1N195 6/ NS CDWR 19500-4216-14 /118 D 43611 Microsemi Lawrence (18) ** 1N196 6/ NS CDWR 19500-4216-14 /118 D 43611 Microsemi Lawrence (18) JAN 1N457 A NS CDWR 19500-2286-08 /193 D 43611 Microsemi Lawrence (1) ** 1N457 6/ NS CDWR 19500-4216-14 /193 D 43611 Microsemi Lawrence (18) JAN 1N458 A NS CDWR 19500-2286-08 /193 D 43611 Microsemi Lawrence (1) ** 1N458 6/ NS CDWR 19500-4216-14 /193 D 43611 Microsemi Lawrence (18) JAN 1N459 A NS CDWR 19500-2286-08 /193 D 43611 Microsemi Lawrence (1) ** 1N459 6/ NS CDWR 19500-4216-14 /193 D 43611 Microsemi Lawrence (18) ** 1N483B A NS CDWR 19500-2922-10 /118 D 43611 Microsemi Lawrence (1) ** 1N483B 6/ NS CDWR 19500-4216-14 /118 D 43611 Microsemi Lawrence (18) ** 1N485B A NS CDWR 19500-2922-10 /118 D 43611 Microsemi Lawrence (1) ** 1N485B 6/ NS CDWR 19500-4216-14 /118 D 43611 Microsemi Lawrence (18) ** 1N486B A NS CDWR 19500-2922-10 /118 D 43611 Microsemi Lawrence (1) ** 1N486B 6/ NS CDWR 19500-4216-14 /118 D 43611 Microsemi Lawrence (18) ** 1N645-1 A 2 CDWR 19500-1474-06 /240 D 43611 Microsemi Lawrence (1) ** 1N645-1 6/ 2 CDWR 19500-4216-14 /240 D 43611 Microsemi Lawrence (18) -2- Supplemental Information Sheet for Electronic QML-19500