IS45S81600E IS45S16800E 16M x 8, 8M x16 DECEMBER 2011 128Mb SYNCHRONOUS DRAM OVERVIEW FEATURES ISSI s 128Mb Synchronous DRAM achieves high-speed Clock frequency: 166, 143 MHz data transfer using pipeline architecture. All inputs and Fully synchronous all signals referenced to a outputs signals refer to the rising edge of the clock input. positive clock edge The 128Mb SDRAM is organized as follows . Interna lbank for hiding row access/precharge Power supply Vdd Vddq IS45S81600E IS45S16800E IS45S81600E 3.3V 3.3V 4M x8 x4 Banks 2M x16 x4 Banks IS45S16800E 3.3V 3.3V 54-pin TSOPII 54-pin TSOPII LVTTL interface 54-ball BGA Programmable burst length (1, 2, 4, 8, full page) Programmable burst sequence: Sequential/Interleave Auto Refresh (CBR) KEY TIMING PARAMETERS Self Refresh Parameter -6 -7 Unit 4096 refresh cycles every 16 ms (A2 grade) or Clk Cycle Time 64 ms (A1 grade) CAS Latency = 3 6 7 ns Random column address every clock cycle CAS Latency = 2 10 10 ns Programmable CAS latency (2, 3 clocks) Clk Frequency CAS Latency = 3 166 143 Mhz Burst read/write and burst read/single write CAS Latency = 2 100 100 Mhz operations capability Access Time from Clock Burst termination by burst stop and precharge CAS Latency = 3 5.4 5.4 ns command CAS Latency = 2 6.5 6.5 ns Automotive Temperature Range: o o Option A1: -40C to +85C o o Option A2: -40C to +105C Copyright 2011 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time with- out notice . ISSI assumes no liability arising out of the application or use of any information, products or services described Customers herein. are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products . Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiv enessProducts. are not authorized for use in such applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that: a.) the risk of injury or damage has been minimized b.) the user assume all such risks and c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances Integrated Silicon Solution, Inc. www.issi.com 1 Rev. E 12/01/2011IS45S81600E, IS45S16800E DEVICE OVERVIEW A self-timed row precharge initiated at the end of the burst The 128Mb SDRAM is a high speed CMOS, dynamic sequence is available with the AUTO PRECHARGE function random-access memory designed to operate in 3.3V Vdd enabled. Precharge one bank while accessing one of the and 3.3V Vddq memory systems containing 134,217,728 other three banks will hide the precharge cycles and provide bits. Internally configured as a quad-bank DRAM with a seamless, high-speed, random-access operation. synchronous interface. Each 33,554,432-bit bank is orga- nized as 4,096 rows by 512 columns by 16 bits or 4,096 SDRAM read and write accesses are burst oriented starting rows by 1,024 columns by 8 bits. at a selected location and continuing for a programmed number of locations in a programmed sequence. The The 128Mb SDRAM includes an AUTO REFRESH MODE, registration of an ACTIVE command begins accesses, and a power-saving, power-down mode. All signals are followed by a READ or WRITE command. The ACTIVE registered on the positive edge of the clock signal, CLK. command in conjunction with address bits registered are All inputs and outputs are LVTTL compatible. used to select the bank and row to be accessed (BA0, The 128Mb SDRAM has the ability to synchronously burst BA1 select the bank A0-A11 select the row). The READ data at a high data rate with automatic column-address or WRITE commands in conjunction with address bits generation, the ability to interleave between internal banks registered are used to select the starting column location to hide precharge time and the capability to randomly for the burst access. change column addresses on each clock cycle during Programmable READ or WRITE burst lengths consist of burst access. 1, 2, 4 and 8 locations or full page, with a burst terminate option. FUNCTIONAL BLOCK DIAGRAM (FOR 2MX16X4 BANKS ONlY) CLK DQML CKE DQMH COMMAND DATA IN CS DECODER BUFFER RAS 16 16 & CAS CLOCK WE REFRESH MODE 2 DQ 0-15 GENERATOR CONTROLLER REGISTER 12 VDD/VDDQ SELF DATA OUT REFRESH A10 BUFFER Vss/VssQ CONTROLLER 16 16 A11 A9 A8 A7 REFRESH A6 COUNTER A5 A4 4096 A3 4096 MEMORY CELL A2 4096 ARRAY A1 4096 12 A0 BANK 0 ROW ROW BA0 ADDRESS ADDRESS BA1 LATCH BUFFER 12 12 SENSE AMP I/O GATE 512 (x 16) COLUMN BANK CONTROL LOGIC ADDRESS LATCH 9 BURST COUNTER COLUMN DECODER COLUMN ADDRESS BUFFER 9 2 Integrated Silicon Solution, Inc. www.issi.com Rev. E 12/01/2011 MULTIPLEXER ROW DECODER