LQH32CN1R0M23L Murata

SpecNo.JELF243A-0039S-01 P1/8 Reference Only CHIP COILCHIP INDUCTORSLQH32CN23L REFERENCE SPECIFICATION 1. Scope This reference specification applies to LQH32CN 23 Series, Chip coil (Chip Inductors). 2. Part Numbering (ex) LQ H 32 C N 1R0 M 2 3 L Product ID Structure Dimension Applications Category Inductance Tolerance Features Electrode Packaging (LW) and L:Taping Characteristics 3. Rating Operating Temperature Range. -40 to +85C Storage Temperature Range. -40 to +85C Self Inductance DC Rated Customer MURATA Resonant Resistance Current Part Number Part Number Frequency (H) Tolerance () (mA) (MHz min) LQH32CN1R0M23L 1.0 0.0930% 96 800 LQH32CN2R2M23L 2.2 20% 0.1330% 64 600 LQH32CN4R7M23L 4.7 0.2030% 43 450 LQH32CN100K23L 10 0.4430% 26 300 LQH32CN220K23L 22 0.7130% 19 250 LQH32CN470K23L 47 1.3 30% 15 170 LQH32CN101K23L 100 3.5 30% 10 100 LQH32CN221K23L 220 10% 8.4 30% 6.8 70 LQH32CN331K23L 330 10.030% 5.6 LQH32CN391K23L 390 17.030% 60 LQH32CN471K23L 470 19.030% 5.0 LQH32CN561K23L 560 22.030% When applied Rated current to the Products, self temperature rise shall be limited to 20C max and Inductance will be within 10% of initial Inductance value. 4. Testing Conditions <Unless otherwise specified> <In case of doubt> Temperature : Ordinary Temperature (15 to 35C) Temperature : 20 2C Humidity : Ordinary Humidity (25 to 85 %(RH)) Humidity : 60 to 70%(RH) Atmospheric Pressure : 86 to 106 kPa 5. Appearance and Dimensions 2.50.2 2.50.2 2.50.2 Unit Mass (Typical value) 3.20.3 0.060g No marking. (in mm) 0.90.3 1.30.2 0.90.3 MURATA MFG.CO., LTD 2.00.2SpecNo.JELF243A-0039S-01 P2/8 Reference Only 6. Electrical Performance No. Item Specification Test Method 6.1 Inductance Inductance shall meet item 3. Measuring EquipmentKEYSIGHT 4192A or equivalent Measuring Frequency 1MHz / 1.0 to 390H 1kHz / 470 to 560H 6.2 DC Resistance DC Resistance shall meet item 3. Measuring EquipmentDigital multi meter 6.3 Self Resonant S.R.F shall meet item 3. Measuring Equipment Frequency(S.R.F) KEYSIGHT E4991A or equivalent 7. Mechanical Performance No. Item Specification Test Method 7.1 Shear Test Chip coil shall not be damaged. SubstrateGlass-epoxy substrate Chip coil Applied Direction Substrate Force10N Hold Duration51s 7.2 Bending Test SubstrateGlass-epoxy substrate (100401.6mm) Speed of Applying Force1mm / s Deflection2mm Hold Duration30s Pressure jig R340 F Deflection 45 45 Product (in mm) 7.3 Vibration Oscillation Frequency10~55~10Hz for 1 minute Total Amplitude1.5mm Testing Time A period of 2 hours in each of 3 mutually perpendicular directions. (Total 6 hours) 7.4 Solderability The wetting area of the electrode FluxEthanol solution of rosin,25(wt)% shall be at least 90% covered with (Immersed for 5s to 10s) new solder coating. SolderSn-3.0Ag-0.5Cu Pre-Heating15010C / 60 to 90seconds Solder Temperature2405C Immersion Time31 s 7.5 Resistance to AppearanceNo damage FluxEthanol solution of rosin,25(wt)% soldering heat (Immersed for 5s to 10s) Inductance Changewithin 5% SolderSn-3.0Ag-0.5Cu Pre-Heating15010C / 60 to 90seconds Solder Temperature2705C Immersion Time101 s Then measured after exposure in the room condition for 242 hours. MURATA MFG.CO., LTD