100307 Low Power Quint Exclusive OR/NOR Gate
August 1989
Revised August 2000
100307
Low Power Quint Exclusive OR/NOR Gate
General Description Features
The 100307 is monolithic quint exclusive-OR/NOR gate. Low Power Operation
The Function output is the wire-OR of all five exclusive-OR
2000V ESD protection
outputs. All inputs have 50 k pull-down resistors.
Pin/function compatible with 100107
Voltage compensated operating range = 4.2V to 5.7V
Available to industrial grade temperature range
(PLCC package only)
Ordering Code:
Order Number Package Number Package Description
1000307PC N24E 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide
1000307QC V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
1000307QI V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Industrial Temperature Range (40C to +85C)
Devices also available in Tape and Reel. Specify by appending the suffix letter X to the ordering code.
Logic Symbol Connection Diagrams
24-Pin DIP
Pin Descriptions
Pin Names Description
D D Data Inputs
na ne
28-Pin PLCC
F Function Output
O O Data Outputs
a e
O O Complementary
a e
Data Outputs
Logic Equation
F = (D D ) + (D D ) + (D D ) +
1a 2a 1b 2b 1c 2c
(D D ) + (D D ).
1d 2d 1e 2e
2000 Fairchild Semiconductor Corporation DS010582 www.fairchildsemi.comAbsolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Storage Temperature (T ) 65C to +150C
STG
Maximum Junction Temperature (T ) +150C
Case Temperature (T )
J
C
V Pin Potential to Ground Pin 7.0V to +0.5V
Commercial 0C to +85C
EE
Input Voltage (DC) V to +0.5V
Industrial 40C to +85C
EE
Output Current (DC Output HIGH) 50 mA
Supply Voltage (V ) 5.7V to 4.2V
EE
ESD (Note 2) 2000V Note 1: The Absolute Maximum Ratings are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. the parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The Recommended Operating Conditions table will define the conditions
for actual device operation.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics (Note 3)
V = 4.2V to 5.7V, V = V = GND, T = 0C to +85C
EE CC CCA C
Symbol Parameter Min Typ Max Units Conditions
V Output HIGH Voltage 1025 955 870 mV V =V Loading with
OH IN IH (Max)
V Output LOW Voltage 1830 1705 1620 mV or V 50 to 2.0V
OL IL (Min)
V Output HIGH Voltage 1035 mV V = V Loading with
OHC IN IH (Min)
V Output LOW Voltage 1610 mV or V 50 to 2.0V
OLC IL (Max)
V Input HIGH Voltage 1165 870 mV Guaranteed HIGH Signal
IH
for All Inputs
V Input LOW Voltage 1830 1475 mV Guaranteed LOW Signal
IL
for All Inputs
I Input LOW Current 0.50 AV = V
IL IN IL (Min)
I Input HIGH Current
IH
D D 250 AV = V (Max)
2a 2e IN IH
D D 350
1a 1e
I Power Supply Current 69 43 30 mA Inputs Open
EE
Note 3: The specified limits represent the worst case value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under worst case conditions.
DIP AC Electrical Characteristics
V = 4.2V to 5.7V, V = V = GND
EE CC CCA
T = 0CT = +25CT = +85C
C C C
Symbol Parameter Units Conditions
Min Max Min Max Min Max
t Propagation Delay
PLH
0.55 1.90 0.55 1.80 0.55 1.90 ns
t D D to O, O
PHL 2a 2e
t Propagation Delay
PLH
0.55 1.70 0.55 1.60 0.55 1.70 ns
t D D to O, O Figures 1, 2
PHL 1a 1e
t Propagation Delay
PLH
1.15 2.75 1.15 2.75 1.15 3.00 ns
t Data to F
PHL
t Transition Time
TLH
0.35 1.20 0.35 1.20 0.35 1.20 ns
t 20% to 80%, 80% to 20%
THL
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100307