Low Voltage Quad 2-Input OR Gate with 5 V Tolerant Inputs 74LCX32 The LCX32 contains four 2input OR gates. The inputs tolerate www.onsemi.com voltages up to 7 V allowing the interface of 5 V systems to 3 V systems. MARKING DIAGRAM The 74LCX32 is fabricated with advanced CMOS technology to achieve high speed operation while maintaining CMOS low power dissipation. ON ZXYKK LCX32 Features 5 V Tolerant Inputs QFN14 3.0x2.5, 0.5P CASE 510CB 2.3 V 3.6 V V Specifications Provided CC 5.5 ns t Max. (V = 3.3 V), 10 mA I Max. PD CC CC 14 Power Down High Impedance Inputs and Outputs ON ZXYKK 24 mA Output Drive (V = 3.0 V) CC LCX32 Implements Proprietary Noise/EMI Reduction Circuitry 1 Latchup Performance Exceeds JEDEC 78 Conditions SOIC14 ESD performance: CASE 751EF Human Body Model >2000 V Machine model >150 V 14 Available on SOIC, TSSOP WB and Leadless QFN Packages ON ZXYKK These are PbFree Devices LCX32 1 TSSOP14 WB CASE 948G LCX32 = Specific Device Code Z = Assembly Plant Code XY = Date Code KK = Lot Run Traceability Code ORDERING INFORMATION See detailed ordering and shipping information on page 8 of this data sheet. Semiconductor Components Industries, LLC, 1995 1 Publication Order Number: April, 2020 Rev. 2 74LCX32/D74LCX32 CONNECTION DIAGRAMS LOGIC SYMBOL Figure 3. IEEE/IEC Figure 1. Pin Assignments for SOIC and TSSOP PIN DESCRIPTION Pin Names Description A , B Inputs n n O Outputs n DAP No Connect 1. DAP (Die Attach Pad) (Top View) (Bottom View) Figure 2. Pad Assignments for DQFN ABSOLUTE MAXIMUM RATINGS Symbol Parameter Rating V Supply Voltage 0.5 V to +7.0 V CC V DC Input Voltage 0.5 V to +7.0 V I V DC Output Voltage, Output in HIGH or LOW State (Note 2) 0.5 V to V + 0.5 V O CC I DC Input Diode Current, V < GND 50 mA IK I I DC Output Diode Current OK V < GND 50 mA O V > V +50 mA O CC I DC Output Source/Sink Current 50 mA O I DC Supply Current per Supply Pin 100 mA CC I DC Ground Current per Ground Pin 100 mA GND T Storage Temperature 65C to +150C STG Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 2. I Absolute Maximum Rating must be observed. O www.onsemi.com 2