CAT24S128 2 128 Kb I C CMOS Serial EEPROM with Software Write Protect Description www.onsemi.com The CAT24S128 is a 128 Kb Serial CMOS EEPROM, internally organized as 16,384 words of 8 bits each. It features a 64byte page write buffer and supports both the 2 Standard (100 kHz), Fast (400 kHz) and FastPlus (1 MHz) I C WLCSP4 WLCSP4 protocol. C4A SUFFIX C4U SUFFIX The device features programmable software write protection which CASE 567KV CASE 567PC provides partial as well as full memory array protection. Features PIN CONFIGURATION 2 Supports Standard, Fast and FastPlus I C Protocol 1 2 1.7 V to 5.5 V Supply Voltage Range A V SCL CC 64Byte Page Write Buffer User Programmable Block Write Protection Protect 1/4, 1/2, 3/4 or Entire EEPROM Array B SDA V SS 2 Schmitt Triggers and Noise Suppression Filters on I C Bus Inputs (SCL and SDA) WLCSP4 (C4A, C4U) (Top View) Low Power CMOS Technology 1,000,000 Program/Erase Cycles 40 Year Data Retention MARKING DIAGRAMS Industrial Temperature Range: 40C to +85C (C4A) (C4U) Ultrathin 4ball WLCSP Package Pin 1 Pin 1 This Device is PbFree, Halogen Free/BFR Free and RoHS Compliant** E = Specific Device Code V CC = (see ordering information) Y = Production Year (Last Digit) M = Production Month (19, O, N, D) W = Production Week Code SCL CAT24S128 SDA PIN FUNCTION Pin Name Function SDA Serial Data Input/Output SCL Serial Clock Input V SS V Power Supply CC Figure 1. Functional Symbol V Ground SS ** For additional information on our Pb Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 9 of this data sheet. Semiconductor Components Industries, LLC, 2015 1 Publication Order Number: May, 2021 Rev. 8 CAT24S128/D E YM E YWCAT24S128 Table 1. ABSOLUTE MAXIMUM RATINGS Parameter Rating Units Storage Temperature 65 to +150 C Voltage on Any Pin with Respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. The DC input voltage on any pin should not be lower than 0.5 V or higher than V + 1.0 V. During transitions, the voltage on any pin may CC undershoot to no less than 1.5 V or overshoot to no more than V + 1.5 V, for periods of less than 20 ns. CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program / Erase Cycles END T (Note 4) Data Retention 40 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C CC 4. T = 55C A Table 3. DC AND AC OPERATING CONDITIONS Supply Voltage / Temperature Range Operation V = 1.7 V to 5.5 V / T = 40C to +85C READ / WRITE CC A V = 1.6 V to 5.5 V / T = 40C to +85C READ CC A V = 1.6 V to 5.5 V / T = 0C to +85C WRITE CC A Table 4. D.C. OPERATING CHARACTERISTICS Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz/1 MHz 1 mA CCR SCL I Write Current 2 mA CCW I Standby Current All I/O Pins at GND or V V 2.5 V 1 A SB CC CC V > 2.5 V 2 CC I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage V 2.5 V 0.5 0.3 V V IL1 CC CC V Input Low Voltage V < 2.5 V 0.5 0.25 V V IL2 CC CC V Input High Voltage V 2.5 V 0.7 V V + 1 V IH1 CC CC CC V Input High Voltage V < 2.5 V 0.75 V V + 1 V IH2 CC CC CC V Output Low Voltage V 2.5 V, I = 3.0 mA 0.4 V OL1 CC OL V Output Low Voltage V < 2.5 V, I = 1.0 mA 0.2 V OL2 CC OL Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. Table 5. PIN IMPEDANCE CHARACTERISTICS Symbol Parameter Conditions Max Units C (Note 5) SDA I/O Pin Capacitance V = 0 V 8 pF IN IN C (Note 5) Input Capacitance (other pins) V = 0 V 6 pF IN IN 5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. www.onsemi.com 2