CAT24S64 2 EEPROM Serial 64-Kb I C with Software Write Protect Description 2 The CAT24S64 is a EEPROM Serial 64Kb I C, internally organized as 8192 words of 8 bits each. www.onsemi.com It features a 64byte page write buffer and supports the Standard 2 (100 kHz), Fast (400 kHz) and FastPlus (1 MHz) I C protocol. The device features programmable software write protection which provides partial as well as full memory array protection. WLCSP4 C4A SUFFIX Features CASE 567KV 2 Supports Standard, Fast and FastPlus I C Protocol 1.7 V to 5.5 V Supply Voltage Range PIN CONFIGURATION 64Byte Page Write Buffer 2 1 User Programmable Block Write Protection Protect 1/4, 1/2, 3/4 or Entire EEPROM Array A SDA V CC 2 Schmitt Triggers and Noise Suppression Filters on I C Bus Inputs (SCL and SDA) B V SCL SS Low Power CMOS Technology 1,000,000 Program/Erase Cycles WLCSP4 (C4A) (Top View) 40 Year Data Retention Industrial Temperature Range: 40C to +85C 4ball WLCSP Package MARKING DIAGRAM This Device is PbFree, Halogen Free/BFR Free and RoHS Pin 1 Compliant** F YM V CC F = Specific Device Code Y = Production Year (Last Digit) M = Production Month (19, O, N, D) SCL CAT24S64 SDA PIN FUNCTION Pin Name Function SDA Serial Data Input/Output SCL Serial Clock Input V SS V Power Supply CC Figure 1. Functional Symbol V Ground SS ** For additional information on our PbFree strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques ORDERING INFORMATION Reference Manual, SOLDERRM/D. See detailed ordering and shipping information in the package dimensions section on page 9 of this data sheet. Semiconductor Components Industries, LLC, 2015 1 Publication Order Number: September, 2018 Rev. 2 CAT24S64/DCAT24S64 Table 1. ABSOLUTE MAXIMUM RATINGS Parameter Rating Units Storage Temperature 65 to +150 C Voltage on Any Pin with Respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. During transitions, voltage undershoot on any pin should not exceed 1 V for more than 20 ns. Voltage overshoot on the SCL and SDA pins should not exceed the absolute maximum ratings, irrespective of V . CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program / Erase Cycles END T (Note 4) Data Retention 40 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C CC 4. T = 55C A Table 3. DC AND AC OPERATING CONDITIONS Supply Voltage / Temperature Range Operation V = 1.7 V to 5.5 V / T = 40C to +85C READ / WRITE CC A V = 1.6 V to 5.5 V / T = 40C to +85C READ CC A V = 1.6 V to 5.5 V / T = 0C to +85C WRITE CC A Table 4. D.C. OPERATING CHARACTERISTICS Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz/1 MHz 1 mA CCR SCL I Write Current 2 mA CCW I Standby Current All I/O Pins at GND or V V 2.5 V 1 A SB CC CC V > 2.5 V 2 CC I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage V 2.5 V 0.5 0.3 V V IL1 CC CC V Input Low Voltage V < 2.5 V 0.5 0.25 V V IL2 CC CC V Input High Voltage V 2.5 V 0.7 V 5.5 V IH1 CC CC V Input High Voltage V < 2.5 V 0.75 V 5.5 V IH2 CC CC V Output Low Voltage V 2.5 V, I = 3.0 mA 0.4 V OL1 CC OL V Output Low Voltage V < 2.5 V, I = 1.0 mA 0.2 V OL2 CC OL Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. Table 5. PIN IMPEDANCE CHARACTERISTICS Symbol Parameter Conditions Max Units C (Note 5) SDA I/O Pin Capacitance V = 0 V 8 pF IN IN C (Note 5) Input Capacitance (other pins) V = 0 V 6 pF IN IN 5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. www.onsemi.com 2