CAT3211MUTAG ON Semiconductor

CAT3211 2 I C Programmable Haptic Driver for Rotary (ERM) DC Motors Description 2 CAT3211 Figure 1. Typical Application Circuit Table 1. ABSOLUTE MAXIMUM RATINGS Parameter Rating Unit VIN 6 V H_TRIG, VIB_EN, SDA, SCL, OSC, RST Voltage 6 to (GND 0.3) V REG Voltage (VIN + 0.3) to (GND 0.3) V POS, NEG Voltage (REG + 1.5) to (PGND 0.3) V Storage Temperature Range 65 to +150 C Junction Temperature Range +150 C Lead Temperature 300 C ESD Immunity V Human Body Model per Standard JESD22 A114E 2000 Machine Model per Standard JESD22A115 A 200 Latchup Immunity per Standard JESD78 mA Logic Pins 100 POS and NEG Pins 600 Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 2. RECOMMENDED OPERATING CONDITIONS Parameter Rating Unit VIN 2.7 to 5.5 V Ambient Temperature Range 40 to +85 C POS and NEG Pin Current (Motor Current) 0 to 600 mA Table 3. ELECTRICAL OPERATING CHARACTERISTICS (Note 1) (Typical values: VIN = 5.0 V, RST = Logic High, T = 25C unless otherwise specificed.) AMB Parameter Symbol Test Conditions Min Typ Max Units Operating Current in Haptic Mode (no load) I Haptic Mode triggered, 270 600 A QH on VIN pin CHIP_EN = 1 (register) Operating Current in Vibrator Mode (no load) I VIB_EN = High, RST = High, 190 600 A QV on VIN pin CHIP_EN = 1 (register) Standby Current on VIN pin I VIB_EN = Low 1 20 A STBY Haptic Mode NOT triggered Shutdown Current I RST = Low 1 A SHDN POS and NEG Shorted HBridge Output Drive Resistance (Note 2) R VIB_EN = High, REG = VIN, 0.8 1.6  HBRDG I = 100 mA LOAD 1. Limits are fully tested at T = 25C and guaranteed across temperature by design and characterization statistical analysis. AMB 2. Total combined resistance of high side and lowside switched (measured at 100 mA load). Does not include LDO Switch Resistance. 3. Limits guaranteed by design and statistical analysis.