KAF-1001
1024 (H) x 1024 (V) Full
Frame CCD Image Sensor
Description
The KAF1001 Image Sensor is a high-performance
charge-coupled device (CCD) designed for a wide range of image
www.onsemi.com
sensing applications.
The sensor incorporates true two-phase CCD technology,
simplifying the support circuits required to drive the sensor as well as
reducing dark current without compromising charge capacity.
The sensor also utilizes the TRUESENSE Transparent Gate Electrode
to improve sensitivity compared to the use of a standard front side
illuminated polysilicon electrode.
Selectable on-chip output amplifiers allow operation to be
optimized for different imaging needs: Low Noise (when using the
high-sensitivity output) or Maximum Dynamic Range (when using the
low-sensitivity output).
Table 1. GENERAL SPECIFICATIONS
Parameter Typical Value Figure 1. KAF1001 CCD Image Sensor
Architecture Full Frame CCD
Pixel Count 1024 (H) 1024 (V)
Features
Pixel Size 24 m (H) 24 m (V)
True Two Phase Full Frame Architecture
Active Image Size 24.6 mm (H) 24.6 mm (V)
TRUESENSE Transparent Gate Electrode
34.8 mm (Diagonal)
for High Sensitivity
APSH Optical Format
100% Fill Factor
Chip Size 28.6 mm (H) 25.5 mm (V)
Low Dark Current
Optical Fill-Factor 100%
Single Readout Register
Saturation Signal
High Sensitivity Output 240,000 electrons
User-selectable Outputs Allow either Low
High Dynamic Range 650,000 electrons
Noise or High Dynamic Range Operation
Output Sensitivity
High Sensitivity Output
11 V/electron Applications
High Dynamic Range
2 V/electron
Scientific
Readout Noise (1 MHz) 15 electrons rms
Medical
2
Dark Current < 30 pA/cm
(25C, Accumulation Mode)
ORDERING INFORMATION
Dark Current Doubling Rate 56C
See detailed ordering and shipping information on page 2 of
Dynamic Range (Sat Sig/Dar Noise)
this data sheet.
High Sensitivity Output 83 dB
High Dynamic Range 97 dB
Quantum Efficiency 40%, 55%, 65%
(450, 550, 650 nm)
Maximum Data Rate
High Sensitivity Output 5 MHz
High Dynamic Range 2 MHz
Transfer Efficiency (2 MHz, to 40C) > 0.99997
Package CERDIP Package (Sidebrazed)
Cover Glass Clear
NOTE: Parameters above are specified at T = 25C unless otherwise noted.
Semiconductor Components Industries, LLC, 2015
1 Publication Order Number:
December, 2015 Rev. 2 KAF1001/DKAF1001
ORDERING INFORMATION
Table 2. ORDERING INFORMATION KAF1001 IMAGE SENSOR
Part Number Description Marking Code
KAF1001AAACPB1 Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Taped Clear Cover Glass (No Coatings), Grade 1
KAF1001AAACPB2 Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Taped Clear Cover Glass (No Coatings), Grade 2
KAF1001AAACPAE Monochrome, No Microlens, CERDIP Package (Sidebrazed), KAF1001AAA
Serial Number
Taped Clear Cover Glass (No Coatings), Engineering Sample
KAF1001AAACBAE Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Clear Cover Glass (No Coatings), Engineering Sample
KAF1001AAACBB2 Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Clear Cover Glass (No Coatings), Grade 2
Table 3. ORDERING INFORMATION EVALUATION SUPPORT
Part Number Description
KEK4H0080KAF1001125 Evaluation Board (Complete Kit)
See the ON Semiconductor Device Nomenclature document (TND310/D) for a full description of the naming convention
used for image sensors. For reference documentation, including information on evaluation kits, please visit our web site at
www.onsemi.com.
www.onsemi.com
2