NLAST4501 Single SPST Analog Switch The NLAST4501 is an analog switch manufactured in submicron silicongate CMOS technology. It achieves very low R while ON maintaining extremely low power dissipation. The device is a bilateral switch suitable for switching either analog or digital signals, which may vary from zero to full supply voltage. NLAST4501 MAXIMUM RATINGS Rating Symbol Value Unit Positive DC Supply Voltage V 0.5 to 7.0 V CC Digital Input Voltage (Enable) V 0.5 to 7.0 V IN Analog Output Voltage (V or V ) V 0.5 to V 0.5 V NO COM IS CC DC Current, Into or Out of Any Pin I 20 mA IK Storage Temperature Range T 65 to 150 C STG Lead Temperature, 1 mm from Case for 10 Seconds T 260 C L Junction Temperature under Bias T 150 C J Thermal Resistance SC705/SC88A (Note 1) 350 C/W JA TSOP5 230 Power Dissipation in Still Air at 85 C SC705/SC88A P 150 mW D TSOP5 200 Moisture Sensitivity MSL Level 1 Flammability Rating Oxygen Index: 30% 35% F UL 94 V0 0.125 in R ESD Withstand Voltage Human Body Model (Note 2) V > 2000 V ESD Machine Model (Note 3) > 100 Charged Device Model (Note 4) N/A Latchup Performance Above V and Below GND at 85 C (Note 5) I 300 mA CC Latchup Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow. 2. Tested to EIA/JESD22A114A. 3. Tested to EIA/JESD22A115A. 4. Tested to JESD22C101A. 5. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Parameter Symbol Min Max Unit Positive DC Supply Voltage V 2.0 5.5 V CC Digital Input Voltage (Enable) V GND 5.5 V IN Static or Dynamic Voltage Across an Off Switch V GND V V IO CC Analog Input Voltage (NO, COM) V GND V V IS CC Operating Temperature Range, All Package Types T 55 125 C A Input Rise or Fall Time, V = 3.3 V 0.3 V t , t 0 100 ns/V cc r f (Enable Input) V = 5.0 V 0.5 V 0 20 cc DEVICE JUNCTION TEMPERATURE VERSUS TIME TO 0.1% BOND FAILURES FAILURE RATE OF PLASTIC = CERAMIC UNTIL INTERMETALLICS OCCUR Junction Temperature C Time, Hours Time, Years 80 1,032,200 117.8 90 419,300 47.9 1 100 178,700 20.4 110 79,600 9.4 1 10 100 1000 120 37,000 4.2 TIME, YEARS 130 17,800 2.0 Figure 2. Failure Rate vs. Time Junction Temperature 140 8,900 1.0