RN1307 to RN1309 Bipolar Transistors Silicon NPN Epitaxial Type (PCT Process)(Bias Resistor built-in Transistor) RN1307/08/09 1. Applications Switching Inverter Circuits Interfacing Driver Circuits 2. Features (1) AEC-Q101 qualified (Please see the orderable part number list) (2) The integrated bias resistor reduces the number of external parts required, making it possible to reduce system size and assembly time. (3) Toshiba offers transistors with a wide range of resistance to accommodate various circuit designs. (4) Complementary to RN2307 to RN2309 3. Equivalent Circuit 4. Bias Resistor Values Part No. R1 (k) R2 (k) RN1307 10 47 RN1308 22 47 RN1309 47 22 Start of commercial production 1988-04 2021 2021-08-24 1 Toshiba Electronic Devices & Storage Corporation Rev.3.0RN1307 to RN1309 5. Packaging and Pin Assignment 1: Base 2: Emitter 3: Collector USM 6. Orderable part number Orderable part number AEC-Q101 Note Note RN1307 RN1307,LF General Use RN1307,LXGF YES (Note 1) Unintended Use (Note 1) RN1307,LXHF YES Automotive Use RN1308 RN1308,LF General Use RN1308,LXGF YES (Note 1) Unintended Use (Note 1) RN1308,LXHF YES Automotive Use RN1309 RN1309,LF General Use RN1309,LXGF YES (Note 1) Unintended Use (Note 1) RN1309,LXHF YES Automotive Use Note 1: For more information, please contact our sales or use the inquiry form on our website. 7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T = 25 ) a Characteristics Symbol Rating Unit Collector-base voltage V 50 V CBO Collector-emitter voltage V 50 CEO Emitter-base voltage RN1307 V 6 V EBO RN1308 7 RN1309 15 Collector current I 100 mA C Collector power dissipation P 100 mW C Junction temperature T 150 j Storage temperature T -55 to 150 stg Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook Handling PrecautionDerating Concept and Method) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 2021 2021-08-24 2 Toshiba Electronic Devices & Storage Corporation Rev.3.0