TC74HC139AF(EL,F) Toshiba

TC74HC139AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC139AP, TC74HC139AF Dual 2-to-4 Line Decoder The TC74HC139A is a high speed CMOS 2-to-4 LINE TC74HC139AP DECODER/DEMULTIPLEXER fabricated with silicon gate 2 C MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. The active low enable input can be used for gating or it can be used as a data input for demultiplexing applications. When the enable input is held H, all four outputs are fixed at a high logic level independent of the other inputs. All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HC139AF Features High speed: t = 16 ns (typ.) at V = 5 V pd CC Low power dissipation: I = 4 A (max) at Ta = 25C CC High noise immunity: V = V = 28% V (min) NIH NIL CC Output drive capability: 10 LSTTL loads Symmetrical output impedance: I = I = 4 mA (min) OH OL Balanced propagation delays: t t pLH pHL Wide operating voltage range: V (opr) = 2 to 6 V CC Weight Pin and function compatible with 74LS139 DIP16-P-300-2.54A : 1.00 g (typ.) SOP16-P-300-1.27A : 0.18 g (typ.) Pin Assignment Start of commercial production 1986-05 1 2014-03-01 TC74HC139AP/AF IEC Logic Symbol Truth Table Inputs Outputs Selected Enable Select Output Y0 Y 1 Y 2 Y3 G B A H X X H H H H None L L L L H H H Y0 L L H H L H H Y 1 Y2 L H L H H L H L H H H H H L Y 3 X: Dont care Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Supply voltage range V 0.5 to 7 V CC DC input voltage V 0.5 to V + 0.5 V IN CC DC output voltage V 0.5 to V + 0.5 V OUT CC Input diode current I 20 mA IK Output diode current I 20 mA OK DC output current I 25 mA OUT DC V /ground current I 50 mA CC CC Power dissipation P 500 (DIP) (Note 2)/180 (SOP) mW D Storage temperature T 65 to 150 C stg Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = 40C to 65C. From Ta = 65C to 85C a derating factor of 10 mW/C shall be applied until 300 mW. 2 2014-03-01