TC7W53FU,LF Toshiba

TC7W53FU/FK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7W53FU, TC7W53FK 2-Channel Multiplexer/Demultiplexer 2 The TC7W53 is a high speed C MOS Analog Multiplexer/ TC7W53FU 2 Demultiplexer fabricated with silicon gate C MOS technology. It achieves the high speed operation similar to equivalent 2 LSTTL while maintaining the C MOS low power dissipation. The TC7W53 has a 2 channel configuration. The digital signal to the control terminal turns ON the corresponding switch of each channel a large amplitude signal (V V ) can then be switched by the small logical amplitude CC EE (V GND) control signal. CC For example, in the case of V = 5 V, GND = 0 V, V = 5 V, CC EE signals between 5 V and +5 V can be switched from the logical (SM8) circuit with a signal power supply of 5 V. As the ON-resistance of TC7W53FK each switch is low, they can be connected to circuit with low input impedance. All inputs are equipped with protection circuits against static discharge or transient excess voltage. Features High speed: t = 15 ns (typ.) at V = 5 V, V = 0 V pd CC EE Low power dissipation: I = 4 A (max) at Ta = 25C CC (US8) High noise immunity: V = V = 28% V (min) NIH NIL CC Weight Low ON resistance: R = 50 (typ.) at V V = 9 V ON CC EE SSOP8-P-0.65: 0.02 g (typ.) High degree of linearity: THD = 0.02% (typ.) at V V =9 V CC EE SSOP8-P-0.50A: 0.01 g (typ.) Pin and function compatible with TC4W53 Marking SM8 US8 Part No. Part No. W 7 W 5 3 5 3 Lot No. Start of commercial production 1997-12 1 2014-11-07 TC7W53FU/FK Absolute Maximum Ratings (Ta = 25C) Characteristics Symbol Rating Unit V 0.5 to 7 CC Supply voltage range V V V 0.5 to 13 CC EE Control input voltage V 0.5 to V + 0.5 V IN CC Switch I/O voltage V V 0.5 to V + 0.5 V I/O EE CC Control input diode current I 20 mA CK I/O diode current I 20 mA IOK Switch through current I 25 mA T DC V /GND current I 25 mA CC CC 300 (SM8) Power dissipation P mW D 200 (US8) Storage temperature range T 65 to 150 C stg Lead temperature (10 s) T 260 C L Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Truth Table Control Input On Channel INH A L L Ch 0 L H Ch 1 H X None X: Dont care Logic Symbol Pin Assignment (top view) V Ch 0 Ch 1 CC A 8 7 6 5 (2) MUXDMUX INH (5) (7) A 2 0 2 1 (1) (6) COM 1 2 3 4 COMMON INH V GND EE 2 2014-11-07