MC74HC244A
Octal 3-State Noninverting
Buffer/Line Driver/
Line Receiver
HighPerformance SiliconGate CMOS
MC74HC244A
MAXIMUM RATINGS
Symbol Parameter Value Unit
This device contains protection
circuitry to guard against damage
V DC Supply Voltage (Referenced to GND) 0.5 to +7.0 V
CC
due to high static voltages or electric
V DC Input Voltage (Referenced to GND) 0.5 to V + 0.5 V
in CC fields. However, precautions must
be taken to avoid applications of any
V DC Output Voltage (Referenced to GND) 0.5 to V + 0.5 V
out CC
voltage higher than maximum rated
I DC Input Current, per Pin 20 mA
voltages to this highimpedance cir-
in
cuit. For proper operation, V and
in
I DC Output Current, per Pin 35 mA
out
V should be constrained to the
out
range GND (V or V ) V .
I DC Supply Current, V and GND Pins 75 mA
in out CC
CC CC
Unused inputs must always be
I Input Clamp Current (V < 0 or V > V ) 20 mA
IK I I CC
tied to an appropriate logic voltage
level (e.g., either GND or V ).
I Output Clamp Current (V < 0 or V > V ) 20 mA CC
OK O O CC
Unused outputs must be left open.
P Power Dissipation in Still Air, SOIC Package 500 mW
D
TSSOP Package 450
T Storage Temperature 65 to +150 C
stg
T Lead Temperature, 1 mm from Case for 10 Seconds C
L
(SOIC, SSOP or TSSOP Package) 260
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of
these limits are exceeded, device functionality should not be assumed, damage may occur and
reliability may be affected.
Derating: SOIC Package: 7 mW/C from 65 to 125C
TSSOP Package: 6.1 mW/C from 65 to 125C
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Max Unit
V DC Supply Voltage (Referenced to GND) 2.0 6.0 V
CC
V , V DC Input Voltage, Output Voltage (Referenced to GND) 0 V V
in out CC
T Operating Temperature, All Package Types 55 +125 C
A
t , t Input Rise and Fall Time V = 2.0 V 0 1000 ns
r f CC
(Figure 1) V = 4.5 V 0 500
CC
V = 6.0 V 0 400
CC
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.