LM2575, NCV2575
1.0 A, Adjustable Output
Voltage, Step-Down
Switching Regulator
The LM2575 series of regulators are monolithic integrated circuits
ideally suited for easy and convenient design of a stepdown
LM2575, NCV2575
Typical Application (Fixed Output Voltage Versions)
Feedback
4 L1
7.0 V - 40 V
+V
in
LM2575
330 H
Unregulated
Output
1
DC Input 5.0 V Regulated
C
in
Output 1.0 A Load
D1
2
100 F
C
out
3OGND 5N/OFF
1N5819
330 F
Representative Block Diagram and Typical Application
Unregulated
DC Input
+V
in
ON/OFF
3.1 V Internal
Output R2
/OFF
ON
Regulator
Voltage Versions
()
1
5
C 3.3 V 1.7 k
in
5.0 V 3.1 k
4
12 V 8.84 k
15 V 11.3 k
Feedback
Current
For adjustable version
Limit
R2 Fixed Gain
R1 = open, R2 = 0
Error Amplifier
Comparator
Driver Regulated
R1
Output
Latch
Freq
1.0 k
L1
V
out
Shift Output
18 kHz
1.0 Amp 2
1.235 V Switch GND
C
D1
out
Band-Gap
Thermal
52 kHz
3
Reset
Load
Reference
Oscillator Shutdown
This device contains 162 active transistors.
Figure 1. Block Diagram and Typical Application
ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.)
Rating Symbol Value Unit
Maximum Supply Voltage V 45 V
in
ON/OFF Pin Input Voltage 0.3 V V +V V
in
Output Voltage to Ground (SteadyState) 1.0 V
Power Dissipation
Case 314B and 314D (TO220, 5Lead) P Internally Limited W
D
Thermal Resistance, JunctiontoAmbient R 65 C/W
JA
Thermal Resistance, JunctiontoCase R 5.0 C/W
JC
2
Case 936A (D PAK) P Internally Limited W
D
Thermal Resistance, Junction toAmbient (Figure 34) R 70 C/W
JA
Thermal Resistance, JunctiontoCase R 5.0 C/W
JC
Storage Temperature Range T 65 to +150 C
stg
Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 k) 2.0 kV
Lead Temperature (Soldering, 10 s) 260 C
Maximum Junction Temperature T 150 C
J
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.