MC10H016FNR2G ON Semiconductor

MC10H016 4Bit Binary Counter Description The MC10H016 is a high-speed synchronous, pre-settable, cascadable 4-bit binary counter. It is useful for a large number of conversion, counting and digital integration applications. www.onsemi.com Features Counting Frequency, 200 MHz Minimum Improved Noise Margin 150 mV (Over Operating Voltage and Temperature Range) 16 20 Voltage Compensated 1 1 MECL 10K Compatible PDIP16 PLLC20 Positive Edge Triggered P SUFFIX FN SUFFIX These Devices are Pb-Free, Halogen Free and are RoHS Compliant CASE 64808 CASE 77502 V V 1 16 CC1 CC2 Q1 Q2 2 15 MARKING DIAGRAMS* Q0 3 14 Q3 120 16 TC CP 4 13 MC10H016P PE MR 5 12 AWLYYWWG 10H016G AWLYYWW P3 CE 6 11 1 PO P2 7 10 V P1 8 9 EE A = Assembly Location WL, L = Wafer Lot Pin assignment is for Dual-in-Line Package YY, Y = Year Figure 1. Pin Assignment WW, W = Work Week G = Pb-Fee Package *For additional marking information, refer to Table 1. TRUTH TABLE Application Note AND8002/D. CE PE MR CP Function L L L Z Load Parallel (P to Q ) n n H L L Z Load Parallel (P to Q ) n n ORDERING INFORMATION L H L Z Count H H L Z Hold Device Package Shipping L ZZ Masters Respond Slaves Hold X X H X Reset (Q = LOW, T = HIGH) X X n C MC10H016FNR2G PLCC20 500/Tape & Reel (Pb-Free) Z = Clock Pulse (Low to High) ZZ = Clock Pulse (High to Low) MC10H016PG PDIP16 25 Units/Tube Features include assertion inputs and outputs on each of the four master/ (Pb-Free) slave counting flip-flops. Terminal count is generated internally in a manner that allows synchronous loading at nearly the speed of the basic counter. For information on tape and reel specifications, in- cluding part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Semiconductor Components Industries, LLC, 2016 1 Publication Order Number: August, 2016 Rev. 9 MC10H016/DMC10H016 Table 2. MAXIMUM RATINGS Symbol Characteristic Rating Unit V Power Supply (V = 0) 8.0 to 0 Vdc EE CC V Input Voltage (V = 0) 0 to V Vdc I CC EE I Output Current mA out Continuous 50 Surge 100 T Operating Temperature Range 0 to +75 C A T Storage Temperature Range C stg Plastic 55 to +150 Ceramic 55 to +165 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Table 3. ELECTRICAL CHARACTERISTICS (V = 5.2 V 5%) (Note 1) EE 0 25 75 Symbol Characteristic Min Max Min Max Min Max Unit I Power Supply Current 126 115 126 mA E I Input Current High A inH All Except MR 450 265 265 Pin 12 MR 1190 700 700 I Input Current Low 0.5 0.5 0.3 A inL V High Output Voltage 1.02 0.84 0.98 0.81 0.92 0.735 Vdc OH V Low Output Voltage 1.95 1.63 1.95 1.63 1.95 1.60 Vdc OL V High Input Voltage 1.17 0.84 1.13 0.81 1.07 0.735 Vdc IH V Low Input Voltage 1.95 1.48 1.95 1.48 1.95 1.45 Vdc IL 1. Each MECL 10H series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 Ifpm is maintained. Outputs are terminated through a 50 resistor to 2.0 V. Table 4. AC CHARACTERISTICS 0 25 75 Symbol Characteristic Min Max Min Max Min Max Unit t Propagation Delay ns pd Clock to Q 1.0 2.4 1.0 2.5 1.0 2.7 Clock to TC 0.7 2.4 0.7 2.5 0.7 2.6 MR to Q 0.7 2.4 0.7 2.5 0.7 2.6 t Set-up Time ns set P to Clock 2.0 2.0 2.0 n CE or PE to Clock 2.5 2.5 2.5 t Hold Time ns hold Clock to P 1.0 1.0 1.0 n Clock to CE or PE 0.5 0.5 0.5 f Counting Frequency 200 200 200 MHz count t Rise Time 0.5 2.0 0.5 2.1 0.5 2.2 ns r t Fall Time 0.5 2.0 0.5 2.1 0.5 2.2 ns f NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. www.onsemi.com 2