MC74AC10NG ON Semiconductor

MC74AC10, MC74ACT10 Triple 3Input NAND Gate Features Outputs Source/Sink 24 mA ACT10 Has TTL Compatible Inputs PbFree Packages are Available MC74AC10, MC74ACT10 RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Typ Max Unit AC 2.0 5.0 6.0 V Supply Voltage V CC ACT 4.5 5.0 5.5 V , V DC Input Voltage, Output Voltage (Ref. to GND) 0 V V in out CC V 3.0 V 150 CC Input Rise and Fall Time (Note 1) t , t V 4.5 V 40 ns/V r f CC AC Devices except Schmitt Inputs V 5.5 V 25 CC V 4.5 V 10 CC Input Rise and Fall Time (Note 2) t , t ns/V r f ACT Devices except Schmitt Inputs V 5.5 V 8.0 CC T Junction Temperature (PDIP) 140 C J T Operating Ambient Temperature Range 40 25 85 C A I Output Current High 24 mA OH I Output Current Low 24 mA OL 1. V from 30% to 70% V see individual Data Sheets for devices that differ from the typical input rise and fall times. in CC 2. V from 0.8 V to 2.0 V see individual Data Sheets for devices that differ from the typical input rise and fall times. in DC CHARACTERISTICS 74AC 74AC T = A V CC T = +25C 40C to Symbol Parameter Unit Conditions A (V) +85C Typ Guaranteed Limits V Minimum High Level 3.0 1.5 2.1 2.1 V = 0.1 V IH OUT Input Voltage 4.5 2.25 3.15 3.15 V or V 0.1 V CC 5.5 2.75 3.85 3.85 V Maximum Low Level 3.0 1.5 0.9 0.9 V = 0.1 V IL OUT Input Voltage 4.5 2.25 1.35 1.35 V or V 0.1 V CC 5.5 2.75 1.65 1.65 V Minimum High Level 3.0 2.99 2.9 2.9 I = 50 A OH OUT Output Voltage 4.5 4.49 4.4 4.4 V 5.5 5.49 5.4 5.4 *V = V or V IN IL IH 3.0 2.56 2.46 12 mA V 4.5 3.86 3.76 I 24 mA OH 5.5 4.86 4.76 24 mA V Maximum Low Level 3.0 0.002 0.1 0.1 I = 50 A OL OUT Output Voltage 4.5 0.001 0.1 0.1 V 5.5 0.001 0.1 0.1 *V = V or V IN IL IH 3.0 0.36 0.44 12 mA V 4.5 0.36 0.44 I 24 mA OL 5.5 0.36 0.44 24 mA I Maximum Input IN 5.5 0.1 1.0 V = V , GND A I CC Leakage Current I 5.5 75 mA V = 1.65 V Max Minimum Dynamic OLD OLD Output Current I 5.5 75 mA V = 3.85 V Min OHD OHD I Maximum Quiescent CC 5.5 4.0 40 A V = V or GND IN CC Supply Current *All outputs loaded thresholds on input associated with output under test. Maximum test duration 2.0 ms, one output loaded at a time. NOTE: I and I 3.0 V are guaranteed to be less than or equal to the respective limit 5.5 V V . IN CC CC