MC74LVX50DR2G ON Semiconductor

MC74LVX50 Hex Buffer The MC74LVX50 is an advanced high speed CMOS buffer fabricated with silicon gate CMOS technology. The internal circuit is composed of three stages, including a buffered output which provides high noise immunity and stable output. The inputs tolerate voltages up to 7.0 V, allowing the interface of 5.0 V MC74LVX50 MAXIMUM RATINGS Symbol Parameter Value Unit V DC Supply Voltage 0.5 to 7.0 V CC V DC Input Voltage 0.5 to 7.0 V IN V DC Output Voltage 0.5 to V 0.5 V OUT CC I DC Input Diode Current V < GND 20 mA IK I I DC Output Diode Current V < GND 20 mA OK O I DC Output Sink Current 25 mA OUT I DC Supply Current per Supply Pin 50 mA CC T Storage Temperature Range 65 to 150 C STG T Lead Temperature, 1 mm from Case for 10 Seconds 260 C L T Junction Temperature under Bias 150 C J Thermal Resistance (Note 1) C/W JA SOIC 125 TSSOP 170 MSL Moisture Sensitivity Level 1 F Flammability Rating Oxygen Index: 30% 35% UL 94V0 0.125 in R V ESD Withstand Voltage Human Body Model (Note 2) > 2000 V ESD Machine Model (Note 3) > 200 Charged Device Model (Note 4) 2000 I Latchup Performance Above V and Below GND at 85 C (Note 5) 300 mA Latchup CC Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow. 2. Tested to EIA/JESD22A114A. 3. Tested to EIA/JESD22A115A. 4. Tested to JESD22C101A. 5. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Max Unit V Supply Voltage 2.0 3.6 V CC V Input Voltage (Note 6) 0 5.5 V I V Output Voltage (HIGH or LOW State) 0 V V O CC T Operating FreeAir Temperature 40 85 C A t/ V Input Transition Rise or Fall Rate V = 3.0 V 0.3 V 0 100 ns/V CC Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 6. Unused inputs may not be left open. All inputs must be tied to a high or lowlogic input voltage level. NOTE: The of the package is equal to 1/Derating. Higher junction temperatures may affect the expected lifetime of the device per the table JA and figure below.