Y NL17SH17 Single Schmitt-Trigger Buffer The NL17SH17 is a single gate CMOS Schmitt trigger noninverting buffer fabricated with silicon gate CMOS technology. The internal circuit is composed of three stages, including a buffer NL17SH17 MAXIMUM RATINGS Symbol Parameter Value Unit V DC Supply Voltage 0.5 to +7.0 V CC V DC Input Voltage 0.5 to +7.0 V IN V DC Output Voltage 0.5 to V + 0.5 V OUT CC I DC Input Diode Current V < GND 20 mA IK IN I DC Output Diode Current V < GND, V > V 20 mA OK OUT OUT CC I DC Output Source/Sink Current 12.5 mA OUT I DC Supply Current per Supply Pin 25 mA CC I DC Ground Current per Ground Pin 25 mA GND T Storage Temperature Range 65 to +150 C STG T Lead Temperature, 1 mm from Case for 10 Seconds 260 C L T Junction Temperature Under Bias +150 C J MSL Moisture Sensitivity Level 1 F Flammability Rating Oxygen Index: 28 to 34 UL 94 V0 0.125 in R V ESD Withstand Voltage Human Body Model (Note 2) >3000 V ESD Machine Model (Note 3) >200 Charged Device Model (Note 4) N/A I Latchup Performance Above V and Below GND at 125C (Note 5) 100 mA LATCHUP CC Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow. 2. Tested to EIA/JESD22A114 A. 3. Tested to EIA/JESD22A115 A. 4. Tested to JESD22C101A. 5. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol Characteristics Min Max Unit V Positive DC Supply Voltage 1.65 5.5 V CC V Digital Input Voltage 0.0 5.5 V IN V Output Voltage 0.0 V V OUT CC T Operating Temperature Range 55 +125 C A t / V Input Transition Rise or Fail Rate V = 3.3 V 0.3 V 0 No Limit ns/V CC V = 5.0 V 0.5 V 0 No Limit CC DEVICE JUNCTION TEMPERATURE VERSUS TIME TO 0.1% BOND FAILURES FAILURE RATE OF PLASTIC = CERAMIC Junction UNTIL INTERMETALLICS OCCUR Temperature C Time, Hours Time, Years 80 1,032,200 117.8 90 419,300 47.9 100 178,700 20.4 1 110 79,600 9.4 120 37,000 4.2 1 10 100 1000 130 17,800 2.0 TIME, YEARS 140 8,900 1.0 Figure 3. Failure Rate vs. Time Junction Temperature