NL17SZ04E Single Inverter The NL17SZ04E is an inverter in three tiny footprint packages. The device performs much as LCX multigate products in speed and drive. Features Tiny SOT353 Package www.onsemi.com 24 mA Sink and Source Output Capability OverVoltage Tolerant Inputs and Outputs MARKING Chip Complexity: FETs = 20 DIAGRAMS 5 Designed for 1.65 V to 5.5 V V Operation CC These Devices are PbFree, Halogen Free/BFR Free and are RoHS 1 L5 M Compliant SOT353/SC705/SC88A DF SUFFIX CASE 419A V NC CC L5 = Specific Device Marking 5 1 M = Date Code* = PbFree Package IN A (Note: Microdot may be in either location) 2 *Date Code orientation and/or position may vary depending upon manufacturing location. GND OUT Y 4 3 PIN ASSIGNMENT Pin Function Figure 1. Pinout (Top View) 1 NC 2 IN A 3 GND IN A 1 OUT Y 4 OUT Y 5 V CC Figure 2. Logic Symbol FUNCTION TABLE Input Output A Y L H H L ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 4 of this data sheet. Semiconductor Components Industries, LLC, 2017 1 Publication Order Number: September, 2018 Rev. 1 NL17SZ04E/DNL17SZ04E MAXIMUM RATINGS Symbol Parameter Value Unit V DC Supply Voltage 0.5 to +6.5 V CC V DC Input Voltage 0.5 to +6.5 V I V DC Output Voltage Active Mode, High or Low State (Note 1) 0.5 to V + 0.5 V O CC PowerDown Mode (V = 0 V) 0.5 to +6.5 CC I DC Input Diode Current V < GND 50 mA IK I I DC Output Diode Current V < GND 50 mA OK O I DC Output Sink Current 50 mA O I DC Supply Current per Supply Pin 100 mA CC I DC Ground Current per Supply Pin 100 mA GND T Storage Temperature Range 65 to 150 C STG T Lead Temperature, 1 mm from Case for 10 Seconds 260 C L T Junction Temperature Under Bias 150 C J Thermal Resistance (Note 2) 350 C/W JA P Power Dissipation in Still Air at 85C 186 mW D MSL Moisture Sensitivity Level 1 F Flammability Rating Oxygen Index: 28 to 34 UL 94 V0 0.125 in R ESD ESD Classification Human Body Model (Note 3) 4000 V Charged Device Model (Note 4) 1000 I Latchup Performance Above V and Below GND at 125C (Note 5) 100 mA LATCHUP CC Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. IO absolute maximum rating must be observed. 2. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow. 3. Tested to EIA/JESD22A114A, rated to EIA/JESD22A114B. 4. Tested to JESD22C101A. 5. Tested to EIA/JESD78. www.onsemi.com 2