S34ML08G1
8 Gb, 1-bit ECC, x8 I/O, 3 V, V
CC
NAND Flash Memory for Embedded
General Description
The Cypress S34ML08G1 8-Gb NAND is offered in 3.3 V with x8 I/O interface. This document contains information for the
CC
S34ML08G1 device, which is a dual-die stack of two S34ML04G1 die. For detailed specifications, please refer to the discrete die
datasheet: S34ML04G1.
Distinctive Characteristics
Density Security
8 Gb (4 Gb 2) One Time Programmable (OTP) area
Hardware program/erase disabled during power transition
Architecture (For each 4 Gb device)
Input / Output Bus Width: 8-bits Additional Features
Page Size: (2048 + 64) bytes; 64 bytes is spare area Supports Multiplane Program and Erase commands
Block Size: 64 Pages or (128k + 4k) bytes Supports Copy Back Program
Plane Size Supports Multiplane Copy Back Program
2048 Blocks per Plane or (256M + 8M) bytes Supports Read Cache
Device Size
Electronic Signature
2 Planes per Device or 512 Mbyte
Manufacturer ID: 01h
NAND Flash Interface
Operating Temperature
Open NAND Flash Interface (ONFI) 1.0 compliant
Industrial: 40 C to 85 C
Address, Data and Commands multiplexed
Automotive: 40 C to 105 C
Supply Voltage
3.3 V device: Vcc = 2.7 V ~ 3.6 V
Performance
Page Read / Program Reliability
Random access: 25 s (Max) 100,000 Program / Erase cycles (Typ)
(with 1 bit / 512 + 16 byte ECC)
Sequential access: 25 ns (Min)
10 Year Data retention (Typ)
Program time / Multiplane Program time: 200 s (Typ)
Blocks zero and one are valid and will be valid for at least
Block Erase / Multiplane Erase (S34ML04G1)
1000 program-erase cycles with ECC
Block Erase time: 3.5 ms (Typ)
Package Options
Lead Free and Low Halogen
48-Pin TSOP 12 20 1.2 mm
63-Ball BGA 9 11 1 mm
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600
Document Number: 002-00483 Rev. *I Revised April 25, 2016S34ML08G1
Contents
General Description ............................................................. 1
Distinctive Characteristics .................................................. 1
Performance.......................................................................... 1
1. Connection Diagram.................................................... 3
2. Pin Description............................................................. 5
3. Block Diagrams............................................................ 6
4. Addressing ................................................................... 8
5. Read Status Enhanced ................................................ 8
6. Extended Read Status ................................................. 8
7. Read ID.......................................................................... 9
7.1 Read Parameter Page ................................................. 10
8. Electrical Characteristics.......................................... 12
8.1 Valid Blocks ................................................................. 12
8.2 Recommended Operating Conditions.......................... 12
8.3 DC Characteristics....................................................... 13
8.4 Pin Capacitance........................................................... 13
8.5 Power Consumptions and Pin Capacitance for Allowed
Stacking Configurations............................................... 13
9. Physical Interface ...................................................... 14
9.1 Physical Diagram......................................................... 14
10. Ordering Information................................................. 16
11. Appendix A Errata ................................................. 17
12. Revision History......................................................... 18
Document Number: 002-00483 Rev. *I Page 2 of 20