CAV25080, CAV25160 EEPROM Serial 8/16-Kb SPI Automotive Grade 1 Description The CAV25080/25160 are a EEPROM Serial 8/16 Kb SPI Automotive Grade 1 devices internally organized as 1024x8/2048x8 www.onsemi.com bits. They feature a 32byte page write buffer and support the Serial Peripheral Interface (SPI) protocol. The device is enabled through a Chip Select (CS) input. In addition, the required bus signals are a clock input (SCK), data input (SI) and data output (SO) lines. The HOLD input may be used to pause any serial communication with the CAV25080/25160 device. These devices feature software and SOIC8 TSSOP8 hardware write protection, including partial as well as full array V SUFFIX Y SUFFIX protection. CASE 751BD CASE 948AL Features Automotive AECQ100 Grade 1 (40C to +125C) Qualified PIN CONFIGURATION 10 MHz SPI Compatible 1 CS V CC 2.5 V to 5.5 V Supply Voltage Range SO HOLD SPI Modes (0,0) & (1,1) WP SCK 32byte Page Write Buffer V SI SS Selftimed Write Cycle SOIC (V), TSSOP (Y) Hardware and Software Protection Block Write Protection Protect 1/4, 1/2 or Entire EEPROM Array PIN FUNCTION Low Power CMOS Technology Pin Name Function 1,000,000 Program/Erase Cycles CS Chip Select 100 Year Data Retention SO Serial Data Output Industrial and Extended Temperature Range WP Write Protect 8lead SOIC and TSSOP Packages These Devices are PbFree, Halogen Free/BFR Free, and RoHS V Ground SS Compliant SI Serial Data Input SCK Serial Clock V CC HOLD Hold Transmission Input V Power Supply CC SI CS CAV25080 CAV25160 SO WP ORDERING INFORMATION See detailed ordering and shipping information in the package HOLD dimensions section on page 10 of this data sheet. SCK V SS Figure 1. Functional Symbol Semiconductor Components Industries, LLC, 2011 1 Publication Order Number: April, 2019 Rev. 2 CAV25080/DCAV25080, CAV25160 MARKING DIAGRAMS 25xx0D AYMXXX SxxD AYMXXX (SOIC8) (TSSOP8) 25080D = CAV25080 S08D = CAV25080 25160D = CAV25160 S16D = CAV25160 A = Assembly Location A = Assembly Location Y = Production Year (Last Digit) Y = Production Year (Last Digit) M = Production Month (19, O, N, D) M = Production Month (19, O, N, D) XXX = Last Three Digits of XXX = Last Three Digits of XXX = Assembly Lot Number XXX = Assembly Lot Number = PbFree Package = PbFree Package Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Operating Temperature 45 to +130 C Storage Temperature 65 to +150 C Voltage on any Pin with Respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. The DC input voltage on any pin should not be lower than 0.5 V or higher than V + 0.5 V. During transitions, the voltage on any pin may CC undershoot to no less than 1.5 V or overshoot to no more than V + 1.5 V, for periods of less than 20 ns. CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program / Erase Cycles END T Data Retention 100 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C. CC Table 3. D.C. OPERATING CHARACTERISTICS (V = 2.5 V to 5.5 V, T = 40C to +125C, unless otherwise specified.) CC A Symbol Parameter Test Conditions Min Max Units I Supply Current (Read Mode) Read, V = 5.5 V, 5 MHz, SO open 2 mA CCR CC I Supply Current (Write Mode) Write, V = 5.5 V, 5 MHz, SO open 3 mA CCW CC I Standby Current V = GND or V , CS = V , 2 A SB1 IN CC CC WP = V , V = 5.5 V CC CC I Standby Current V = GND or V , CS = V , 5 A SB2 IN CC CC WP = GND, V = 5.5 V CC I Input Leakage Current V = GND or V 2 2 A L IN CC I Output Leakage Current CS = V , 1 2 A LO CC V = GND or V OUT CC V Input Low Voltage 0.5 0.3 V V IL CC V Input High Voltage 0.7 V V + 0.5 V IH CC CC V Output Low Voltage I = 3.0 mA 0.4 V OL1 OL V Output High Voltage I = 1.6 mA V 0.8 V V OH1 OH CC www.onsemi.com 2