KAF-1001 1024 (H) x 1024 (V) Full Frame CCD Image Sensor Description The KAF1001 Image Sensor is a high-performance charge-coupled device (CCD) designed for a wide range of image www.onsemi.com sensing applications. The sensor incorporates true two-phase CCD technology, simplifying the support circuits required to drive the sensor as well as reducing dark current without compromising charge capacity. The sensor also utilizes the TRUESENSE Transparent Gate Electrode to improve sensitivity compared to the use of a standard front side illuminated polysilicon electrode. Selectable on-chip output amplifiers allow operation to be optimized for different imaging needs: Low Noise (when using the high-sensitivity output) or Maximum Dynamic Range (when using the low-sensitivity output). Table 1. GENERAL SPECIFICATIONS Parameter Typical Value Figure 1. KAF1001 CCD Image Sensor Architecture Full Frame CCD Pixel Count 1024 (H) 1024 (V) Features Pixel Size 24 m (H) 24 m (V) True Two Phase Full Frame Architecture Active Image Size 24.6 mm (H) 24.6 mm (V) TRUESENSE Transparent Gate Electrode 34.8 mm (Diagonal) for High Sensitivity APSH Optical Format 100% Fill Factor Chip Size 28.6 mm (H) 25.5 mm (V) Low Dark Current Optical Fill-Factor 100% Single Readout Register Saturation Signal High Sensitivity Output 240,000 electrons User-selectable Outputs Allow either Low High Dynamic Range 650,000 electrons Noise or High Dynamic Range Operation Output Sensitivity High Sensitivity Output 11 V/electron Applications High Dynamic Range 2 V/electron Scientific Readout Noise (1 MHz) 15 electrons rms Medical 2 Dark Current < 30 pA/cm (25C, Accumulation Mode) ORDERING INFORMATION Dark Current Doubling Rate 56C See detailed ordering and shipping information on page 2 of Dynamic Range (Sat Sig/Dar Noise) this data sheet. High Sensitivity Output 83 dB High Dynamic Range 97 dB Quantum Efficiency 40%, 55%, 65% (450, 550, 650 nm) Maximum Data Rate High Sensitivity Output 5 MHz High Dynamic Range 2 MHz Transfer Efficiency (2 MHz, to 40C) > 0.99997 Package CERDIP Package (Sidebrazed) Cover Glass Clear NOTE: Parameters above are specified at T = 25C unless otherwise noted. Semiconductor Components Industries, LLC, 2015 1 Publication Order Number: December, 2015 Rev. 2 KAF1001/DKAF1001 ORDERING INFORMATION Table 2. ORDERING INFORMATION KAF1001 IMAGE SENSOR Part Number Description Marking Code KAF1001AAACPB1 Monochrome, No Microlens, CERDIP Package (Sidebrazed), Taped Clear Cover Glass (No Coatings), Grade 1 KAF1001AAACPB2 Monochrome, No Microlens, CERDIP Package (Sidebrazed), Taped Clear Cover Glass (No Coatings), Grade 2 KAF1001AAACPAE Monochrome, No Microlens, CERDIP Package (Sidebrazed), KAF1001AAA Serial Number Taped Clear Cover Glass (No Coatings), Engineering Sample KAF1001AAACBAE Monochrome, No Microlens, CERDIP Package (Sidebrazed), Clear Cover Glass (No Coatings), Engineering Sample KAF1001AAACBB2 Monochrome, No Microlens, CERDIP Package (Sidebrazed), Clear Cover Glass (No Coatings), Grade 2 Table 3. ORDERING INFORMATION EVALUATION SUPPORT Part Number Description KEK4H0080KAF1001125 Evaluation Board (Complete Kit) See the ON Semiconductor Device Nomenclature document (TND310/D) for a full description of the naming convention used for image sensors. For reference documentation, including information on evaluation kits, please visit our web site at www.onsemi.com. www.onsemi.com 2