LQA05TC600 Qspeed Family 600 V, 5 A Q-Series PFC Diode Product Summary General Description I 5 A F(AVG) This device has the lowest Q of any 600 V RR V 600 V RRM Silicon diode. Its recovery characteristics Q (Typ at 125 C) 27 nC RR increase efficiency, reduce EMI and eliminate I (Typ at 125 C) 1.65 A RRM snubbers. Softness t /t (Typ at 125 C) 1.4 b a Applications Power Factor Correction (PFC) Boost Diode Pin Assignment Motor drive circuits DC-AC Inverters Features NCNC Low Q , Low I , Low t RR RRM RR NCNC CC High dI /dt capable (1000A/s) F Soft recovery AA Benefits Increases efficiency AC Eliminates need for snubber circuits TO-220AC Reduces EMI filter component size & count RoHS Compliant Enables extremely fast switching Package uses Lead-free plating and Green mold compound. Halogen free per IEC 61249-2-21. Absolute Maximum Ratings Absolute maximum ratings are the values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Symbol Parameter Conditions Rating Units V Peak repetitive reverse voltage 600 V RRM I Average forward current T = 150 C, T = 115 C 5 A F(AVG) J C I Non-repetitive peak surge current 60 Hz, cycle 50 A FSM I Non-repetitive peak surge current cycle of t=28 s Sinusoid, T =25 C 350 A FSM C T Maximum junction temperature 150 C J(MAX) T Storage temperature 55 to 150 C STG Lead soldering temperature Leads at 1.6 mm from case, 10 sec 300 C V Isolation voltage (leads-to-tab) DC, + to tab 2500 V ISOL P Power dissipation T = 25 C 43.1 W D C Thermal Resistance Symbol Resistance from: Conditions Rating Units R Junction to ambient TO-220 62 C/W JA Junction to case TO-220 2.9 C/W R JC www.powerint.com January 2011 LQA05TC600 Electrical Specifications at T = 25 C (unless otherwise specified) J Symbol Parameter Conditions Min Typ Max Units DC Characteristics I Reverse current V = 600V, T = 25 C - - 15 R R J A V = 600V, T = 125 C - 0.4 - mA R J V Forward voltage I = 5A, T = 25 C - 2.825 3.14 V F F J I = 5A, T = 150 C - 2.28 - V F J C Junction capacitance V = 10V, 1 MHz - 21 - pF J R Dynamic Characteristics t TReverse recovery time =25 C - 11 15 ns RR dI/dt =200A/s J V =400V, I =5A R F T =125 C - 24 - ns J Q TReverse recovery charge dI/dt =200A/ s =25 C - 6 10 nC RR J V =400V, I =5A R F T=125 C - 27 - nC J I TMaximum reverse =25 C - 0.95 1.3 A RRM dI/dt =200A/s J recovery current V =400V, I =5A R F T =125 C - 1.65 - A J S T =25 C - 1 - dI/dt =200A/s J t b Softness factor = V =400V, I =5A R F T =125 C - 1.4 - J t a Note to component engineers: Q-Series diodes employ Schottky technologies in their design and construction. Therefore, Component Engineers should plan their test setups to be similar to those for traditional Schottky test setups. (For additional details, see Application Note AN-300.) VR D1 L1 DUT I t F RR 15V Pulse generator dI /dt + F Rg t t a b Q1 0 0.1xI RRM I RRM Figure 2. Reverse Recovery Test Circuit Figure 1. Reverse Recovery Definitions 2 www.powerint.com Rev 1.9 01/11