TC7SZ07AFS CMOS Digital Integrated Circuits Silicon Monolithic TC7SZ07AFSTC7SZ07AFSTC7SZ07AFSTC7SZ07AFS 1. 1. Functional DescriptionFunctional Description 1. 1. Functional DescriptionFunctional Description Non-Inverter (Open Drain) 2. 2. 2. 2. FeaturesFeaturesFeaturesFeatures (1) Wide operating temperature range: T = -40 to 125 (Note 1) opr (2) High output current: 24 mA (min) at V = 3.0 V CC (3) Super high speed operation: t = 2.3 ns (typ.) at V = 5.0 V, C = 50 pF PZL CC L (4) Operation voltage range: V = 1.65 to 5.5 V CC (5) 5.5 V tolerant inputs (6) 5.5 V power down protection output Note 1: For devices with the ordering part number ending in J(T. T = -40 to 85 for the other devices. opr 3. 3. PackagingPackaging 3. 3. PackagingPackaging fSV Start of commercial production 2008-03 2016-2019 2019-01-30 1 Toshiba Electronic Devices & Storage Corporation Rev.3.0TC7SZ07AFS 4. 4. 4. 4. Marking and Pin AssignmentMarking and Pin AssignmentMarking and Pin AssignmentMarking and Pin Assignment MarkingMarkingMarkingMarking Pin Assignment (Top view)Pin Assignment (Top view)Pin Assignment (Top view)Pin Assignment (Top view) 5. 5. 5. 5. IEC Logic SymbolIEC Logic SymbolIEC Logic SymbolIEC Logic Symbol 6. 6. Truth TableTruth Table 6. 6. Truth TableTruth Table A Y L L H Z Z: High impedance 7. 7. 7. 7. Absolute Maximum Ratings (Note) (Unless otherwise specified, TAbsolute Maximum Ratings (Note) (Unless otherwise specified, TAbsolute Maximum Ratings (Note) (Unless otherwise specified, TAbsolute Maximum Ratings (Note) (Unless otherwise specified, T = 25 = 25 = 25 = 25 )))) aaaa Characteristics Symbol Note Rating Unit Supply voltage V -0.5 to 6.0 V CC Input voltage V -0.5 to 6.0 V IN DC output voltage V (Note 1) -0.5 to 6.0 V OUT Input diode current I -20 mA IK Output diode current I (Note 2) -20 mA OK DC output current I 50 mA OUT V /ground current I 50 mA CC CC Power dissipation P 50 mW D Storage temperature T -65 to 150 stg Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: I absolute maximum rating must be observed. OUT Note 2: V < GND OUT 2016-2019 2019-01-30 2 Toshiba Electronic Devices & Storage Corporation Rev.3.0