TTA008B Bipolar Transistors Silicon PNP Epitaxial Type TTA008BTTA008BTTA008BTTA008B 1. 1. ApplicationsApplications 1. 1. ApplicationsApplications Power Amplifiers Power Switching 2. 2. 2. 2. FeaturesFeaturesFeaturesFeatures (1) High DC current gain : h = 100 to 200 (I = -0.5 A) FE C (2) Low collector emitter saturation voltage : V = -0.5 V (max) (I = -1A) CE(sat) C (3) High-speed switching : t = 300 ns (typ.) (I = -1A) stg C (4) Complementary to TTC015B 3. 3. Packaging and Internal Circuit (Note)Packaging and Internal Circuit (Note) 3. 3. Packaging and Internal Circuit (Note)Packaging and Internal Circuit (Note) 1. Emitter 2. Collector 3. Base TO-126N Note: Although this device is encapsulated in epoxy resin, it does not provide any guarantee to the maximum isolation voltage. Therefore, as with the case with non-isolated devices, care should be taken with regard to electrical isolation from surrounding parts. Start of commercial production 2013-09 2015-01-22 1 Rev.1.0TTA008B 4. 4. 4. 4. Absolute Maximum Ratings (Note) (TAbsolute Maximum Ratings (Note) (TAbsolute Maximum Ratings (Note) (TAbsolute Maximum Ratings (Note) (T = 25 = 25 = 25 = 25 unless otherwise specified) unless otherwise specified) unless otherwise specified) unless otherwise specified) aaaa Characteristics Symbol Rating Unit Collector-base voltage V -80 V CBO Collector-emitter voltage V -80 CEO Emitter-base voltage V -7 EBO Collector current (DC) (Note 1) I -2 A C Collector current (pulsed) (Note 1) I -4 CP Base current I -0.5 B Collector power dissipation P 1.5 W C Collector power dissipation (T = 25 ) P 10 c C Junction temperature T 150 j Storage temperature T -55 to 150 stg Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook Handling PrecautionDerating Concept and Method) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Ensure that the junction temperature does not exceed 150 . 5. 5. Electrical CharacteristicsElectrical Characteristics 5. 5. Electrical CharacteristicsElectrical Characteristics 5.1. 5.1. 5.1. 5.1. Static Characteristics (TStatic Characteristics (TStatic Characteristics (TStatic Characteristics (T = 25 = 25 = 25 = 25 unless otherwise specified) unless otherwise specified) unless otherwise specified) unless otherwise specified) aaaa Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current I V = -80 V, I = 0 A -100 nA CBO CB E Emitter cut-off current I V = -7 V, I = 0 A -100 EBO EB C Collector-emitter breakdown voltage V I = -10 mA, I = 0 A -80 V (BR)CEO C B DC current gain h V = -2 V, I = -1 mA 80 FE(1) CE C h V = -2 V, I = -0.5 A 100 200 FE(2) CE C h V = -2 V, I = -1 A 60 FE(3) CE C Collector-emitter saturation voltage V I = -0.5 A, I = -50 mA -0.3 V CE(sat)(1) C B V I = -1 A, I = -100 mA -0.5 CE(sat)(2) C B Base-emitter saturation voltage V I = -1 A, I = -100 mA -1.5 BE(sat) C B 2015-01-22 2 Rev.1.0