CY7C1548KV18/CY7C1550KV18 72-Mbit DDR II+ SRAM Two-Word Burst Architecture (2.0 Cycle Read Latency) 72-Mbit DDR II+ SRAM Two-Word Burst Architecture (2.0 Cycle Read Latency) Features Configurations 72-Mbit density (4M 18, 2M 36) With Read Cycle Latency of 2.0 cycles: CY7C1548KV18 4M 18 450-MHz clock for high bandwidth CY7C1550KV18 2M 36 2-word burst for reducing address bus frequency Double data rate (DDR) interfaces (data transferred at Functional Description 900 MHz) at 450 MHz The CY7C1548KV18, and CY7C1550KV18 are 1.8V Available in 2.0 clock cycle latency Synchronous Pipelined SRAMs equipped with DDR II+ architecture. The DDR II+ consists of an SRAM core with Two input clocks (K and K) for precise DDR timing advanced synchronous peripheral circuitry. Addresses for read SRAM uses rising edges only and write are latched on alternate rising edges of the input (K) Echo clocks (CQ and CQ) simplify data capture in high-speed clock. Write data is registered on the rising edges of both K and systems K. Read data is driven on the rising edges of K and K. Each address location is associated with two 18-bit words Data valid pin (QVLD) to indicate valid data on the output (CY7C1548KV18), or 36-bit words (CY7C1550KV18) that burst sequentially into or out of the device. Synchronous internally self-timed writes Asynchronous inputs include an output impedance matching DDR II+ operates with 2.0 cycle read latency when DOFF is input (ZQ). Synchronous data outputs (Q, sharing the same asserted HIGH physical pins as the data inputs D) are tightly matched to the two Operates similar to DDR I device with 1 cycle read latency when output echo clocks CQ/CQ, eliminating the need for separately DOFF is asserted LOW capturing data from each individual DDR SRAM in the system design. 1 Core V = 1.8 V 0.1 V I/O V = 1.4 V to V DD DDQ DD All synchronous inputs pass through input registers controlled by Supports both 1.5 V and 1.8 V I/O supply the K or K input clocks. All data outputs pass through output High-speed transceiver logic (HSTL) inputs and variable drive registers controlled by the K or K input clocks. Writes are HSTL output buffers conducted with on-chip synchronous self-timed write circuitry. For a complete list of related documentation, click here. Available in 165-ball fine pitch ball grid array (FBGA) package (13 15 1.4 mm) Offered in both Pb-free and non Pb-free packages JTAG 1149.1 compatible test access port Phase-Locked Loop (PLL) for accurate Data Placement Selection Guide Description 450 MHz 400 MHz Unit Maximum operating frequency 450 400 MHz Maximum operating current 18 650 590 mA 36 820 750 Note 1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V = 1.4 V to V . DDQ DD Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600 Document Number: 001-15879 Rev. *Q Revised March 11, 20162M x 18 Array 1M x 36 Array 2M x 18 Array 1M x 36 Array CY7C1548KV18/CY7C1550KV18 Logic Block Diagram CY7C1548KV18 Write Write 21 A Reg Reg (20:0) Address Register 18 LD K Output CLK R/W Logic K Gen. Control DOFF Read Data Reg. 36 CQ V REF 18 18 Reg. Reg. CQ Control R/W Logic 18 18 BWS 1:0 Reg. DQ 18 17:0 QVLD Logic Block Diagram CY7C1550KV18 Write Write 20 A Reg Reg (19:0) Address Register 36 LD K Output CLK R/W Logic K Gen. Control DOFF Read Data Reg. 72 CQ V REF 36 36 Reg. Reg. CQ Control R/W Logic 36 36 BWS 3:0 Reg. DQ 36 35:0 QVLD Document Number: 001-15879 Rev. *Q Page 2 of 29 Write Add. Decode Write Add. Decode Read Add. Decode Read Add. Decode