X-On Electronics has gained recognition as a prominent supplier of FQB55N10 MOSFETs across the USA, India, Europe, Australia, and various other global locations. FQB55N10 MOSFETs are a product manufactured by ON Semiconductor. We provide cost-effective solutions for MOSFETs, ensuring timely deliveries around the world.

FQB55N10 ON Semiconductor

FQB55N10 electronic component of ON Semiconductor
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See Product Specifications
Part No.FQB55N10
Manufacturer: ON Semiconductor
Category: MOSFETs
Description: MOSFET QF 100V 26MOHM D2PAK
Datasheet: FQB55N10 Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 3.2596 ea
Line Total: USD 3.26 
Availability - 0
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
0
Ship by Fri. 22 Nov to Thu. 28 Nov
MOQ : 1
Multiples : 1
1 : USD 3.2596
10 : USD 2.5798
100 : USD 2.0467
500 : USD 1.6289
800 : USD 1.3974

   
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We are delighted to provide the FQB55N10 from our MOSFETs category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the FQB55N10 and other electronic components in the MOSFETs category and beyond.

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FQB55N10 N-Channel QFET MOSFET November 2013 FQB55N10 N-Channel QFET MOSFET 100 V, 55 A, 26 m Description Features This N-Channel enhancement mode power MOSFET is 55 A, 100 V, R = 26 m (Max.) V = 10 V, DS(on) GS produced using Fairchild Semiconductors proprietary planar I = 27.5 A D stripe and DMOS technology. This advanced MOSFET Low Gate Charge (Typ. 75 nC) technology has been especially tailored to reduce on-state resistance, and to provide superior switching performance Low Crss (Typ. 130 pF) and high avalanche energy strength. These devices are 100% Avalanche Tested suitable for switched mode power supplies, active power factor correction (PFC), and electronic lamp ballasts. 175C Maximum Junction Temperature Rating D D G G 2 S D -PAK S Absolute Maximum Ratings T = 25C unless otherwise noted. C Symbol Parameter FQB55N10 TM Unit V Drain-Source Voltage 100 V DSS I - Continuous (T = 25C) Drain Current 55 A D C - Continuous (T = 100C) 38.9 A C I (Note 1) Drain Current - Pulsed 220 A DM V Gate-Source Voltage 25 V GSS E (Note 2) Single Pulsed Avalanche Energy 1100 mJ AS I Avalanche Current (Note 1) 55 A AR E Repetitive Avalanche Energy (Note 1) 15.5 mJ AR dv/dt Peak Diode Recovery dv/dt (Note 3) 6.0 V/ns Power Dissipation (T = 25C) * P 3.75 W A D Power Dissipation (T = 25C) 155 W C - Derate above 25C 1.03 W/C T , T Operating and Storage Temperature Range -55 to +175 C J STG Maximum lead temperature for soldering, T 300 C L 1/8 from case for 5 seconds Thermal Characteristics Symbol Parameter Unit FQB55N10TM R Thermal Resistance, Junction to Case, Max. 0.97 JC o Thermal Resistance, Junction to Ambient (Minimum Pad of 2-oz Copper), Max. 62.5 C/W R JA 2 Thermal Resistance, Junction to Ambient (*1 in Pad of 2-oz Copper), Max. 40 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com 1 FQB55N10 Rev. C1 FQB55N10 N-Channel QFET MOSFET Package Marking and Ordering Information Part Number Top Mark Package Packing Method Reel Size Tape Width Quantity 2 FQB55N10 D -PAK Tape and Reel 330 mm 24 mm 800 units FQB55N10TM Electrical Characteristics T = 25C unless otherwise noted. C Symbol Parameter Test Conditions Min . Typ . Max . Unit Off Characteristics BV V = 0 V, I = 250 A Drain-Source Breakdown Voltage 100 -- -- V DSS GS D BV DSS Breakdown Voltage Temperature I = 250 A, Referenced to 25C -- 0.1 -- V/C D / T Coefficient J I V = 100 V, V = 0 V -- -- 1 A DSS DS GS Zero Gate Voltage Drain Current V = 80 V, T = 150C -- -- 10 A DS C I V = 25 V, V = 0 V Gate-Body Leakage Current, Forward -- -- 100 nA GSSF GS DS I V = -25 V, V = 0 V Gate-Body Leakage Current, Reverse -- -- -100 nA GSSR GS DS On Characteristics V V = V , I = 250 A Gate Threshold Voltage 2.0 -- 4.0 V GS(th) DS GS D R Static Drain-Source DS(on) V = 10 V, I = 27.5 A -- 0.021 0.026 GS D On-Resistance g V = 40 V, I = 27.5 A Forward Transconductance -- 38 -- S FS DS D Dynamic Characteristics C Input Capacitance -- 2100 2730 pF iss V = 25 V, V = 0 V, DS GS C Output Capacitance -- 640 830 pF oss f = 1.0 MHz C Reverse Transfer Capacitance -- 130 170 pF rss Switching Characteristics t Turn-On Delay Time -- 25 60 ns d(on) V = 50 V, I = 55 A, DD D t Turn-On Rise Time -- 250 510 ns r R = 25 G t Turn-Off Delay Time -- 110 230 ns d(off) (N ote 4) t Turn-Off Fall Time -- 140 290 ns f Q Total Gate Charge -- 75 98 nC g V = 80 V, I = 55 A, DS D Q Gate-Source Charge -- 13 -- nC gs V = 10 V GS (Note 4) Q Gate-Drain Charge -- 36 -- nC gd Drain-Source Diode Characteristics and Maximum Ratings I Maximum Continuous Drain-Source Diode Forward Current -- -- 55 A S I Maximum Pulsed Drain-Source Diode Forward Current -- -- 220 A SM V V = 0 V, I = 55 A Drain-Source Diode Forward Voltage -- -- 1.5 V SD GS S t Reverse Recovery Time V = 0 V, I = 55 A, -- 100 -- ns rr GS S Q dI / dt = 100 A/s Reverse Recovery Charge -- 380 -- nC rr F Notes: 1. Repetitive rating : pulse-width limited by maximum junction temperature. 2. L = 0.55 mH, I = 55 A, V = 25 V, R = 25 , starting T = 25C. AS DD G J 3. I 55 A, di/dt 300 A/s , V BV starting T = 25C. SD DD DSS, J 4. Essentially independent of operating temperature. 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com 2 FQB55N10 Rev. C1

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8541.21.00 16 No - - With a dissipation rate of less than 1 W Free

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