CY14E256LA 256-Kbit (32 K 8) nvSRAM 256-Kbit (32 K 8) nvSRAM Features Functional Description 25 ns and 45 ns access times The Cypress CY14E256LA is a fast static RAM, with a nonvolatile element in each memory cell. The memory is Internally organized as 32 K 8 (CY14E256LA) organized as 32 KB. The embedded nonvolatile elements Hands-off automatic STORE on power-down with only a small incorporate QuantumTrap technology, producing the worlds capacitor most reliable nonvolatile memory. The SRAM provides infinite read and write cycles, while independent nonvolatile data STORE to QuantumTrap nonvolatile elements initiated by resides in the highly reliable QuantumTrap cell. Data transfers software, device pin, or autostore on power-down from the SRAM to the nonvolatile elements (the STORE RECALL to SRAM initiated by software or power-up operation) takes place automatically at power-down. On power-up, data is restored to the SRAM (the RECALL operation) Infinite read, write, and RECALL cycles from the nonvolatile memory. Both the STORE and RECALL 1 million STORE cycles to QuantumTrap operations are also available under software control. For a complete list of related documentation, click here. 20-year data retention Single 5 V + 10% operation Industrial temperature 44-pin thin small-outline package (TSOP) Type II and 32-pin small-outline integrated circuit (SOIC) package Pb-free and restriction of hazardous substances (RoHS) compliant Logic Block Diagram V V CC CAP QuantumTrap 512 X 512 A POWER 5 CONTROL A STORE 6 A 7 A 8 STATIC RAM STORE/ RECALL A 9 ARRAY RECALL HSB A 11 CONTROL 512 X 512 A 12 A 13 A 14 SOFTWARE A - A DETECT 13 0 COLUMN I/O DQ 0 DQ 1 COLUMN DEC DQ 2 DQ 3 DQ 4 DQ A A A A A A 0 1 4 5 2 3 10 DQ 6 DQ 7 OE CE WE Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600 Document Number: 001-54952 Rev. *K Revised November 14, 2014 INPUT BUFFERS ROW DECODERCY14E256LA Contents Pinouts ..............................................................................3 AC Switching Characteristics ....................................... 10 Pin Definitions ..................................................................3 SRAM Read Cycle .................................................... 10 Device Operation ..............................................................4 SRAM Write Cycle ..................................................... 10 SRAM Read ................................................................4 Switching Waveforms .................................................... 10 SRAM Write .................................................................4 AutoStore/Power-up RECALL ....................................... 12 AutoStore Operation ....................................................4 Switching Waveforms .................................................... 12 Hardware STORE Operation .......................................4 Software Controlled STORE/RECALL Cycle ................ 13 Hardware RECALL (Power-up) ...................................5 Switching Waveforms .................................................... 13 Software STORE .........................................................5 Hardware STORE Cycle ................................................. 14 Software RECALL .......................................................5 Switching Waveforms .................................................... 14 Preventing AutoStore ..................................................6 Truth Table For SRAM Operations ................................ 15 Data Protection ............................................................6 Ordering Information ...................................................... 15 Maximum Ratings .............................................................7 Ordering Code Definitions ......................................... 15 Operating Range ...............................................................7 Package Diagrams .......................................................... 16 DC Electrical Characteristics ..........................................7 Acronyms ........................................................................17 Data Retention and Endurance .......................................8 Document Conventions ................................................. 17 Capacitance ......................................................................8 Units of Measure ....................................................... 17 Thermal Resistance ..........................................................8 Document History Page ................................................. 18 AC Test Loads ..................................................................9 Sales, Solutions, and Legal Information ...................... 19 AC Test Conditions ..........................................................9 Worldwide Sales and Design Support ....................... 19 Products ....................................................................19 PSoC Solutions ......................................................... 19 Document Number: 001-54952 Rev. *K Page 2 of 19