TYPICAL PERFORMANCE CURVES APT40GP90JDQ2 900V APT40GP90JDQ2 POWER MOS 7 IGBT The POWER MOS 7 IGBT is a new generation of high voltage power IGBTs. Using Punch Through Technology this IGBT is ideal for many high frequency, high voltage switching applications and has been optimized for high frequency switchmode power supplies.UL Recognize file E145592 ISOTOP Low Conduction Loss SSOA Rated Low Gate Charge C Ultrafast Tail Current shutoff G E MAXIMUM RATINGS All Ratings: T = 25C unless otherwise specied. C Symbol Parameter UNIT APT40GP90JDQ2 V Collector-Emitter Voltage 900 CES Volts V Gate-Emitter Voltage 30 GE 7 I Continuous Collector Current T = 25C 64 C1 C I Continuous Collector Current T = 110C 27 Amps C2 C 1 I Pulsed Collector Current 160 CM Switching Safe Operating Area T = 150C SSOA 160A 900V J P Total Power Dissipation Watts 284 D T ,T Operating and Storage Junction Temperature Range -55 to 150 J STG C T Max. Lead Temp. for Soldering: 0.063 from Case for 10 Sec. L 300 STATIC ELECTRICAL CHARACTERISTICS Symbol Characteristic / Test Conditions MIN TYP MAX Units V Collector-Emitter Breakdown Voltage (V = 0V, I = 350A) 900 (BR)CES GE C V Gate Threshold Voltage (V = V , I = 1mA, T = 25C) GE(TH) 3 4.5 6 CE GE C j Volts Collector-Emitter On Voltage (V = 15V, I = 40A, T = 25C) 3.2 3.9 GE C j V CE(ON) Collector-Emitter On Voltage (V = 15V, I = 40A, T = 125C) 2.7 GE C j 2 Collector Cut-off Current (V = 900V, V = 0V, T = 25C) 350 CE GE j I A CES 2 Collector Cut-off Current (V = 900V, V = 0V, T = 125C) 1500 CE GE j I Gate-Emitter Leakage Current (V = 20V) nA GES 100 GE CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed. APT Website - DYNAMIC CHARACTERISTICS APT40GP90JDQ2 Symbol Characteristic Test Conditions MIN TYP MAX UNIT C 3300 Input Capacitance Capacitance ies C pF 325 Output Capacitance V = 0V, V = 25V oes GE CE C f = 1 MHz 35 Reverse Transfer Capacitance res V V Gate-to-Emitter Plateau Voltage Gate Charge 7.5 GEP 3 Q V = 15V Total Gate Charge 145 g GE V = 450V Q nC Gate-Emitter Charge 22 CE ge I = 40A Q C 55 Gate-Collector Mille) Charge gc T = 150C, R = 4.3, V = J G GE Switching Safe Operating Area SSOA A 160 15V, L = 100H,V = 900V CE t Inductive Switching (25C) Turn-on Delay Time d(on) 14 V = 600V t Current Rise Time 23 CC r ns t V = 15V Turn-off Delay Time d(off) GE 90 I = 40A t C Current Fall Time 60 f R = 4.3 4 G E Turn-on Switching Energy TBD on1 T = +25C 5 J E J Turn-on Switching Energy (Diode) 1350 on2 6 E Turn-off Switching Energy 795 off t Inductive Switching (125C) Turn-on Delay Time d(on) 14 t V = 600V Current Rise Time 23 r CC ns V = 15V t Turn-off Delay Time GE d(off) 130 I = 40A t C Current Fall Time f 90 R = 4.3 4 4 G E Turn-on Switching Energy TBD on1 T = +125C 55 J E J Turn-on Switching Energy (Diode) 2280 on2 6 E Turn-off Switching Energy 1245 off THERMAL AND MECHANICAL CHARACTERISTICS Symbol Characteristic UNIT MIN TYP MAX R Junction to Case (IGBT) .44 JC C/W R Junction to Case (DIODE) 1.1 JC W gm Package Weight 29.2 T V RMS Voltage (50-60hHz Sinusoidal Wavefomr Ffrom Terminals to Mounting Base for 1 Min.) Volts 2500 Isolation 1 Repetitive Rating: Pulse width limited by maximum junction temperature. 2 For Combi devices, I includes both IGBT and FRED leakages ces 3 See MIL-STD-750 Method 3471. 4 E is the clamped inductive turn-on energy of the IGBT only, without the effect of a commutating diode reverse recovery current on1 adding to the IGBT turn-on loss. Tested in inductive switching test circuit shown in gure 21, but with a Silicon Carbide diode. 5 E is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching on2 loss. (See Figures 21, 22.) 6 E is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.) off 7 Continuous current limited by package lead temperature. APT Reserves the right to change, without notice, the specications and information contained h 050-7492 Rev A 2-2006